Predicting Muon-Induced SEU Rates for a 28-nm SRAM Using Protons and Heavy Ions to Calibrate the Sensitive Volume Model
Trippe, J. M., Reed, R. A., Austin, R. A., Sierawski, B. D., Massengill, L. W., Weller, R. A., Warren, K. M., Schrimpf, R. D., Narasimham, B., Bartz, B., Reed, D.
Published in IEEE transactions on nuclear science (01.02.2018)
Published in IEEE transactions on nuclear science (01.02.2018)
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Journal Article
Electron-Induced Single-Event Upsets in Static Random Access Memory
King, M. P., Reed, R. A., Weller, R. A., Mendenhall, M. H., Schrimpf, R. D., Sierawski, B. D., Sternberg, A. L., Narasimham, B., Wang, J. K., Pitta, E., Bartz, B., Reed, D., Monzel, C., Baumann, R. C., Deng, X., Pellish, J. A., Berg, M. D., Seidleck, C. M., Auden, E. C., Weeden-Wright, S. L., Gaspard, N. J., Zhang, C. X., Fleetwood, D. M.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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CRÈME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code
Adams, J. H., Barghouty, A. F., Mendenhall, M. H., Reed, R. A., Sierawski, B. D., Warren, K. M., Watts, J. W., Weller, R. A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes
Ball, D. R., Hutson, J. M., Javanainen, A., Lauenstein, J.-M., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Sierawski, B. D., Witulski, A. F., Reed, R. A., Schrimpf, R. D.
Published in IEEE transactions on nuclear science (01.01.2020)
Published in IEEE transactions on nuclear science (01.01.2020)
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Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS Imager
Hu, M. D., McCurdy, M. W., Sierawski, B. D., Schrimpf, R. D., Reed, R. A., Alles, M. L.
Published in IEEE transactions on nuclear science (01.04.2024)
Published in IEEE transactions on nuclear science (01.04.2024)
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Journal Article
Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs
Ball, D. R., Sierawski, B. D., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., Reed, R. A., Schrimpf, R. D., Javanainen, A., Lauenstein, J.-M
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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Journal Article
Comparison of Total-Ionizing-Dose Effects in Bulk and SOI FinFETs at 90 and 295 K
Haeffner, T. D., Reed, R. A., Schrimpf, R. D., Fleetwood, D. M., Keller, R. F., Jiang, R., Sierawski, B. D., Mccurdy, M. W., Zhang, E. X., Mohammed, R. W., Ball, D. R., Alles, M. L.
Published in IEEE transactions on nuclear science (01.06.2019)
Published in IEEE transactions on nuclear science (01.06.2019)
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Journal Article
The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate
Dodds, N. A., Martinez, M. J., Dodd, P. E., Shaneyfelt, M. R., Sexton, F. W., Black, J. D., Lee, D. S., Swanson, S. E., Bhuva, B. L., Warren, K. M., Reed, R. A., Trippe, J., Sierawski, B. D., Weller, R. A., Mahatme, N., Gaspard, N. J., Assis, T., Austin, R., Weeden-Wright, S. L., Massengill, L. W., Swift, G., Wirthlin, M., Cannon, M., Liu, R., Chen, L., Kelly, A. T., Marshall, P. W., Trinczek, M., Blackmore, E. W., Wen, S.-J, Wong, R., Narasimham, B., Pellish, J. A., Puchner, H.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs
Trippe, J. M., Reed, R. A., Austin, R. A., Sierawski, B. D., Weller, R. A., Funkhouser, E. D., King, M. P., Narasimham, B., Bartz, B., Baumann, R., Labello, J., Nichols, J., Schrimpf, R. D., Weeden-Wright, S. L.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
The SIRE2 Toolkit
Adams, J. H., Robinson, Z. D., Nonnast, J. H., Fisher, J. H., Hope, D. M., Lane, Z. B., Reed, R. A., Fisher, J. Z., Warren, K. M., Sierawski, B. D.
Published in Space Weather (01.07.2020)
Published in Space Weather (01.07.2020)
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Journal Article
General Framework for Single Event Effects Rate Prediction in Microelectronics
Weller, R.A., Reed, R.A., Warren, K.M., Mendenhall, M.H., Sierawski, B.D., Schrimpf, R.D., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
Impact of Ion Energy and Species on Single Event Effects Analysis
Reed, R.A., Weller, R.A., Mendenhall, M.H., Lauenstein, J.-M., Warren, K.M., Pellish, J.A., Schrimpf, R.D., Sierawski, B.D., Massengill, L.W., Dodd, P.E., Shaneyfelt, M.R., Felix, J.A., Schwank, J.R., Haddad, N.F., Lawrence, R.K., Bowman, J.H., Conde, R.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Reducing Soft Error Rate in Logic Circuits Through Approximate Logic Functions
Sierawski, B.D., Bhuva, B.L., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools
Warren, K.M., Sierawski, B.D., Weller, R.A., Reed, R.A., Mendenhall, M.H., Pellish, J.A., Schrimpf, R.D., Massengill, L.W., Porter, M.E., Wilkinson, J.D.
Published in IEEE electron device letters (01.02.2007)
Published in IEEE electron device letters (01.02.2007)
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Journal Article
Satometer: how much have we searched?
Aloul, F.A., Sierawski, B.D., Sakallah, K.A.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2003)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2003)
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Journal Article
Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions
Sierawski, B.D., Pellish, J.A., Reed, R.A., Schrimpf, R.D., Warren, K.M., Weller, R.A., Mendenhall, M.H., Black, J.D., Tipton, A.D., Xapsos, M.A., Baumann, R.C., Xiaowei Deng, Campola, M.J., Friendlich, M.R., Kim, H.S., Phan, A.M., Seidleck, C.M.
Published in IEEE transactions on nuclear science (01.12.2009)
Published in IEEE transactions on nuclear science (01.12.2009)
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Journal Article
The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets
Clemens, M. A., Sierawski, B. D., Warren, K. M., Mendenhall, M. H., Dodds, N. A., Weller, R. A., Reed, R. A., Dodd, P. E., Shaneyfelt, M. R., Schwank, J. R., Wender, S. A., Baumann, R. C.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction
Weeden-Wright, S. L., King, Michael Patrick, Hooten, N. C., Bennett, W. G., Sierawski, B. D., Schrimpf, R. D., Weller, R. A., Reed, R. A., Mendenhall, M. H., Fleetwood, D. M., Alles, M. L., Baumann, R. C.
Published in IEEE transactions on nuclear science (01.02.2015)
Published in IEEE transactions on nuclear science (01.02.2015)
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Journal Article
Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM
Warren, Kevin M., Weller, Robert A., Sierawski, Brian D., Reed, Robert A., Mendenhall, Marcus H., Schrimpf, Ronald D., Massengill, Lloyd W., Porter, Mark E., Wilkinson, Jeffrey D., LaBel, Kenneth A., Adams, James H.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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