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Published in IEEE journal of the Electron Devices Society (2024)
Published in IEEE journal of the Electron Devices Society (2024)
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Journal Article
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Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
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Conference Proceeding
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection
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Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28nm node
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Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28 nm node
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Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Conference Proceeding
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI
Chohan, Talha, Zhao, Zhixing, Lehmann, Steffen, Arfaoui, Wafa, Bossu, Germain, Trommer, Jens, Slesazeck, Stefan, Mikolajick, Thomas, Siddabathula, Mahesh
Published in IEEE transactions on device and materials reliability (01.09.2022)
Published in IEEE transactions on device and materials reliability (01.09.2022)
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Magazine Article