by Siahlo, A. I., Poklonski, N. A., Vyrko, S. A., Ratkevich, S. V.
Published in Semiconductors (Woodbury, N.Y.) (01.12.2018)

by Poklonski, N A, Vyrko, S A, Siahlo, A I, Poklonskaya, O N, Ratkevich, S V, Hieu, N N, Kocherzhenko, A A
Published in Materials research express (16.01.2019)

by Siahlo, A. I., Vyrko, S. A., Ratkevich, S. V., Poklonski, N. A., Vlassov, A. T., Hieu, N. N., Lozovik, Yu. E.
Published in Semiconductors (Woodbury, N.Y.) (01.12.2020)

by Siahlo, A. I., Popov, A. M., Poklonskii, N. A., Lozovik, Yu. E.
Published in Technical physics letters (01.07.2017)

by Poklonski, N. A., Dzeraviaha, A. N., Vyrko, S. A., Siahlo, A. I.
Published in Journal of applied spectroscopy (01.09.2017)

by Poklonski, N. A., Siahlo, A. I., Vyrko, S. A., Ratkevich, S. V., Vlassov, A. T.
Published in Pribory i metody izmererij (15.03.2019)

by Poklonski, N. A., Vyrko, S. A., Vlassov, A. T., Siahlo, A. I., Ratkevich, S. V.
Published in Pribory i metody izmererij (17.12.2018)

by Siahlo, A.I., Oxenlwe, L.K., Berg, K.S., Clausen, A.T., Andersen, P.A., Peucheret, C., Tersigni, A., Jeppesen, P., Hansen, K.P., Folkenberg, J.R.
Published in IEEE photonics technology letters (01.08.2003)

by Siahlo, A.I., Clausen, A.T., Oxenlowe, L.K., Seoane, J., Berg, K.S., Zhenbo Xu, Jianming Zeng, Jeppesen, P.
Published in IEEE photonics technology letters (01.02.2005)

by Poklonski, N A, Siahlo, A I, Vyrko, S A, Popov, A M, Lozovik, Yu E, Lebedeva, I V, Knizhnik, A A
Published in arXiv.org (14.12.2015)

by Popov, A M, Lebedeva, I V, Knizhnik, A A, Lozovik, Yu E, Poklonski, N A, Siahlo, A I, Vyrko, S A, Ratkevich, S V
Published in arXiv.org (13.06.2014)

by N. A. Poklonski, S. A. Vyrko, O. N. Poklonskaya, N. I. Gorbachuk, A. I. Siahlo
Published in Pribory i metody izmererij (01.03.2015)

by Poklonski, N A, Kislyakov, E F, Vyrko, S A, Hieu, N N, Bubel', O N, Siahlo, A I, Lebedeva, I V, Knizhnik, A A, Popov, A M, Lozovik, Yu E
Published in arXiv.org (24.04.2010)

by Poklonski, N A, Nguyen, Ngoc Hieu, Kislyakov, E F, Vyrko, S A, Siahlo, A I, Popov, A M, Lozovik, Yu E
Published in arXiv.org (23.04.2010)

by N. A. Poklonski, A. I. Siahlo, V. T. Shnitko, V. A. Merkulov, O. M. Davidenia, A. I. Kovalev
Published in Pribory i metody izmererij (01.03.2015)

by Clausen, A.T., Siahlo, A.I., Seoane, J., Oxenløwe, L.K., Jeppesen, P.
Published in Electronics letters (03.03.2005)

by Clausen, A T, Siahlo, A I, Seoane, J, Oxenløwe, L K, Jeppesen, P
Published in Electronics letters (03.03.2005)

by Siahlo, A.I., Clausen, A.T., Oxenlowe, L.K., Seoane, J., Jeppesen, P.
Published in (CLEO). Conference on Lasers and Electro-Optics, 2005 (2005)

by Clausen, A.T., Poulsen, H.N., Oxenlowe, L.K., Siahlo, A.I., Seoane, J., Jeppesen, P.
Published in The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003 (2003)