The effect of sub-oxide phases on the transparency of tin-doped gallium oxide
Lim, K., Schelhas, L. T., Siah, S. C., Brandt, R. E., Zakutayev, A., Lany, S., Gorman, B., Sun, C. J., Ginley, D., Buonassisi, T., Toney, M. F.
Published in Applied physics letters (03.10.2016)
Published in Applied physics letters (03.10.2016)
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Journal Article
Proof-of-concept framework to separate recombination processes in thin silicon wafers using transient free-carrier absorption spectroscopy
Siah, S. C., Winkler, M. T., Powell, D. M., Johnston, S. W., Kanevce, A., Levi, D. H., Buonassisi, T.
Published in Journal of applied physics (14.03.2015)
Published in Journal of applied physics (14.03.2015)
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Journal Article
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities
Naik, V. B., Lim, J. H., Yamane, K., Kwon, J., B., Behin-Aein, Chung, N. L., K, S., Hau, L. Y., Chao, R., Chiang, C., Huang, Y., Pu, L., Otani, Y., Jang, S.H., Balasankaran, N., Neo, W. P., Ling, T., Ting, J. W., Yoon, H., Mueller, J., Pfefferling, B., Kallensee, O., Merbeth, T., Seet, C.S., Wong, J., You, Y. S., Soss, S., Chan, T. H., Siah, S. Y.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Whole-Genome Sequencing of Two Moroccan Mycobacterium tuberculosis Strains
Laamarti, M, El Mrimar, N, Alouane, T, Kartti, S, Belouad, E, Bssaibis, F, Zegmout, A, El Jaoudi, R, Maleb, A, Abid, A, El Hajjami, N, Lemnouer, A, Siah, S, Belyamani, L, Elouennass, M, Ibrahimi, A
Published in Microbiology resource announcements (07.01.2021)
Published in Microbiology resource announcements (07.01.2021)
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Journal Article
Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production
Lee, T. Y., Yamane, K., Hau, L. Y., Chao, R., Chung, N. L., Naik, V. B., Sivabalan, K., Kwon, J., Lim, J. H., Neo, W. P., Khua, K., Thiyagarajah, N., Jang, S. H., Behin-Aein, B., Toh, E. H., Otani, Y., Zeng, D., Balasankaran, N., Goh, L. C., Ling, T., Hwang, J., Zhang, L., Low, R., Tan, S. L, Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
A Reliable TDDB Lifetime Projection Model Verified Using 40Mb STT-MRAM Macro at Sub-ppm Failure Rate To Realize Unlimited Endurance for Cache Applications
Naik, V. B., Yamane, K., Lim, J. H., Lee, T. Y., Kwon, J., Aein, Behin, Chung, N. L., Hau, L. Y., Chao, R., Zeng, D., Otani, Y., Chiang, C, Huang, Y., Pu, L., Thiyagarajah, N., Jang, S. H., Neo, W. P., Dixit, H., Aris, S.K, Goh, L. C., Ling, T., Hwang, J., Ting, J. W., Zhang, L., Low, R., Balasankaran, N., Seet, C. S., Ong, S., Wong, J., You, Y. S., Woo, S. T., Siah, S. Y.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
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Conference Proceeding
Fast Switching of STT-MRAM to Realize High Speed Applications
Lee, T. Y., Yamane, K., Kwon, J., Naik, V. B., Otani, Y., Zeng, D., Lim, J. H., Sivabalan, K., Chiang, C., Huang, Y., Jang, S. H., Hau, L. Y., Chao, R., Chung, N. L., Neo, W. P., Khua, K., Thiyagarajah, N., Ling, T., Goh, L. C., Hwang, J., Zhang, L., Low, R., Balasankaran, N., Tan, F., Wong, J., Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Siah, S. Y.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
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Conference Proceeding
Analysis of Risk Factors Related to Severity and Mortality Due to Nosocomial Infections in Burn Patients of the Military Hospital Mohamed V, Rabat, Morocco
Koraichi, S, Arfaoui, A, Kafsaoui, S, Janah, H, Sbayi, A, Mrabet, M, Siah, S, Quyou, A
Published in Annual research & review in biology (10.01.2017)
Published in Annual research & review in biology (10.01.2017)
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Journal Article
Manufacturable 22nm FD-SOI Embedded MRAM Technology for Industrial-grade MCU and IOT Applications
Naik, V. B., Lim, J. H., Lee, T. Y., Neo, W. P., Dixit, H., K, S., Goh, L. C., Ling, T., Hwang, J., Zeng, D., Ting, J. W., Lee, K., Toh, E. H., Zhang, L., Low, R., Balasankaran, N., Zhang, L. Y., Gan, K. W., Hau, L. Y., Mueller, J., Pfefferling, B., Kallensee, O., Yamane, K., Tan, S. L., Seet, C. S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y., Pellerin, J., Chao, R., Kwon, J., Thiyagarajah, N., Chung, N. L., Jang, S. H., Behin-Aein, B.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
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Conference Proceeding
Selection of gate length and gate bias to make nanoscale metal–oxide-semiconductor transistors less sensitive to both statistical gate length variation and temperature variation
Yang, Peizhen, Lau, W.S., Lai, Seow Wei, Lo, V.L., Siah, S.Y., Chan, L.
Published in Solid-state electronics (01.11.2010)
Published in Solid-state electronics (01.11.2010)
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Journal Article
Observation of halo implant from the drain side reaching the source side and vice versa in extremely short p-channel transistors
Lau, W.S., Yang, Peizhen, Lim, Eng Hua, Tang, Yee Ling, Lai, Seow Wei, Lo, V.L., Siah, S.Y., Chan, L.
Published in Microelectronics and reliability (01.03.2010)
Published in Microelectronics and reliability (01.03.2010)
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Journal Article
A case study for micro-grid PV: Rural electrification in India
Loka, P., Moola, S., Reddy, S., Skumanich, A., Fulton, S., Siah, S. C., Mints, P.
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
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Conference Proceeding
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1 μm metal–oxide–semiconductor transistors by quasi-ballistic transport theory
Lau, W.S., Yang, Peizhen, Ho, V., Toh, L.F., Liu, Y., Siah, S.Y., Chan, L.
Published in Microelectronics and reliability (01.10.2008)
Published in Microelectronics and reliability (01.10.2008)
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Journal Article
Effects of switching from [left angle bracket]1 1 0[right-pointing angle bracket] to [left angle bracket]1 0 0[right-pointing angle bracket] channel orientation and tensile stress on n-channel and p-channel metal-oxide-semiconductor transistors
Yang, Peizhen, Lau, W S, Lai, Seow Wei, Lo, V L, Siah, SY, Chan, L
Published in Solid-state electronics (01.04.2010)
Published in Solid-state electronics (01.04.2010)
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Journal Article
Mechanism for improvement of n-channel metal-oxide-semiconductor transistors by tensile stress
Yang, Peizhen, Lau, W. S., Lai, Seow Wei, Lo, V. L., Toh, L. F., Wang, Jacob, Siah, S. Y., Chan, L.
Published in Journal of applied physics (01.08.2010)
Published in Journal of applied physics (01.08.2010)
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Journal Article
JEDEC-Qualified Highly Reliable 22nm FD-SOI Embedded MRAM For Low-Power Industrial-Grade, and Extended Performance Towards Automotive-Grade-1 Applications
Naik, V. B., Yamane, K., Lee, T.Y., Kwon, J., Chao, R., Lim, J.H., Chung, N.L., Behin-Aein, B., Hau, L.Y., Zeng, D., Otani, Y., Chiang, C., Huang, Y., Pu, L., Jang, S.H., Neo, W.P., Dixit, H., Goh, S. K L. C., Toh, E. H., Ling, T., Hwang, J., Ting, J.W., Low, R., Zhang, L., Lee, C.G., Balasankaran, N., Tan, F., Gan, K. W., Yoon, H., Congedo, G., Mueller, J., Pfefferling, B., Kallensee, O., Vogel, A., Kriegerstein, V., Merbeth, T., Seet, C.S., Ong, S., Xu, J., Wong, J., You, Y.S., Woo, S.T., Chan, T.H., Quek, E., Siah, S. Y.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding
Advanced MTJ Stack Engineering of STT-MRAM to Realize High Speed Applications
Lee, T. Y., Yamane, K., Otani, Y., Zeng, D., Kwon, J., Lim, J. H., Naik, V. B., Hau, L. Y., Chao, R., Chung, N. L., Ling, T., Jang, S. H., Goh, L. C., Hwang, J., Zhang, L., Low, R., Balasankaran, N., Tan, F., Ting, J. W., Chang, J., Seet, C. S., Ong, S., You, Y. S., Woo, S. T., Chan, T. H., Siah, S. Y.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding
Atomic Layer Deposited Gallium Oxide Buffer Layer Enables 1.2 V Open-Circuit Voltage in Cuprous Oxide Solar Cells
Lee, Yun Seog, Chua, Danny, Brandt, Riley E., Siah, Sin Cheng, Li, Jian V., Mailoa, Jonathan P., Lee, Sang Woon, Gordon, Roy G., Buonassisi, Tonio
Published in Advanced materials (Weinheim) (16.07.2014)
Published in Advanced materials (Weinheim) (16.07.2014)
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