High-Temperature Characteristics of Ti/Al/Ni/Au Ohmic Contacts to n-GaN
Yue-Zong, Zhang, Shi-Wei, Feng, Chun-Sheng, Guo, Guang-Chen, Zhang, Si-Xiang, Zhuang, Rong, Su, Yun-Xia, Bai, Chang-Zhi, Lu
Published in Chinese physics letters (01.11.2008)
Published in Chinese physics letters (01.11.2008)
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Journal Article
Reliability evaluation of power VDMOSFET
Yun-Xia Bai, Chun-Sheng Guo, Shi-Wei Feng, Kai-Kai Ding, Si-Xiang Zhuang, Rong Su
Published in 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2009)
Published in 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2009)
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Conference Proceeding