Ion-sensing devices with silicon nitride and borosilicate glass insulators
Harame, D.L., Bousse, L.J., Shott, J.D., Meindl, J.D.
Published in IEEE transactions on electron devices (01.08.1987)
Published in IEEE transactions on electron devices (01.08.1987)
Get full text
Journal Article
Hot-electron-induced minority-carrier generation in bipolar junction transistors
Ishiuchi, H., Tamba, N., Shott, J.D., Knorr, C.J., Wong, S.S.
Published in IEEE electron device letters (01.11.1990)
Published in IEEE electron device letters (01.11.1990)
Get full text
Journal Article
Reproducibility of electromigration measurements
Schafft, H.A., Staton, T.C., Mandel, J., Shott, J.D.
Published in IEEE transactions on electron devices (01.03.1987)
Published in IEEE transactions on electron devices (01.03.1987)
Get full text
Journal Article
A new MOSFET output conductance measurement technique
Faheem Akram, M., Plummer, J.D., Shott, J.D.
Published in IEEE transactions on instrumentation and measurement (01.10.1993)
Published in IEEE transactions on instrumentation and measurement (01.10.1993)
Get full text
Journal Article
Using simulators to model transmitted variability in IC manufacturing
Sharifzadeh, S., Koehler, J.R., Owen, A.B., Shott, J.D.
Published in IEEE transactions on semiconductor manufacturing (01.08.1989)
Published in IEEE transactions on semiconductor manufacturing (01.08.1989)
Get full text
Journal Article
Performance limits of CMOS ULSI
Pfiester, J.R., Shott, J.D., Meindl, J.D.
Published in IEEE transactions on electron devices (01.02.1985)
Published in IEEE transactions on electron devices (01.02.1985)
Get full text
Journal Article
Performance Limits of CMOS ULSI
Pfiester, J.R., Shott, J.D., Meindl, J.D.
Published in IEEE journal of solid-state circuits (01.02.1985)
Published in IEEE journal of solid-state circuits (01.02.1985)
Get full text
Journal Article
Hydrogenation by ion implantation for scaled SOI/PMOS transistors
Singh, H.J., Saraswat, K.C., Shott, J.D., McVittie, J.P., Meindl, J.D.
Published in IEEE electron device letters (01.03.1985)
Published in IEEE electron device letters (01.03.1985)
Get full text
Journal Article
Refinements in the measurement of depleted generation lifetime
Eades, W.D., Shott, J.D., Swanson, R.M.
Published in IEEE transactions on electron devices (01.10.1983)
Published in IEEE transactions on electron devices (01.10.1983)
Get full text
Journal Article
A polycrystalline-Si/sub 1-x/Ge/sub x/-gate CMOS technology
King, T.-J., Pfiester, J.R., Shott, J.D., McVittie, J.P., Saraswat, K.C.
Published in International Technical Digest on Electron Devices (1990)
Published in International Technical Digest on Electron Devices (1990)
Get full text
Conference Proceeding
Novel programmable high-speed analog transversal filter
Green, J.B., Kino, G.S., Walker, J.T., Shott, J.D.
Published in IEEE electron device letters (01.10.1982)
Published in IEEE electron device letters (01.10.1982)
Get full text
Journal Article
Hot-electron-induced minority carrier generation in bipolar junction transistors
Ishiuchi, H., Tamba, N., Shott, J.D., Knorr, C.J., Wong, S.S.
Published in International Technical Digest on Electron Devices Meeting (1989)
Published in International Technical Digest on Electron Devices Meeting (1989)
Get full text
Conference Proceeding
Scaling of SOI/PMOS transistors
Singh, H.J., Saraswat, K.C., Shott, J.D., McVittie, J.P., Meindl, J.D.
Published in 1983 International Electron Devices Meeting (1983)
Published in 1983 International Electron Devices Meeting (1983)
Get full text
Conference Proceeding