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Risk Assessment of Post-Fault Temporary Overvoltage Using Generalized Short-Circuit Ratio
Xin, Huanhai, Liu, Xinyu, Zheng, Di, Chen, Dong, Zhou, Yuhan, Marshall, Benjamin
Published in IEEE transactions on power systems (01.01.2024)
Published in IEEE transactions on power systems (01.01.2024)
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Adaptive Neural Observer for Short Circuit Fault Estimation of Lithium-Ion Batteries in Electric Vehicles
Xu, Yiming, Ge, Xiaohua, Shen, Weixiang
Published in IEEE transactions on power electronics (01.01.2024)
Published in IEEE transactions on power electronics (01.01.2024)
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Double-Phase Adaptive Neural Network for Condition-based Monitoring of p-GaN HEMT under Repetitive Short Circuit Stresses
Mei, Wenjuan, Liu, Zhen, Pan, Chaowu, Li, Ouhang, Su, Yuanzhang, Zhou, Qi
Published in IEEE transactions on instrumentation and measurement (01.01.2023)
Published in IEEE transactions on instrumentation and measurement (01.01.2023)
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Internal Short Circuit Analysis of Cylindrical Lithium-Ion Cells Due to Structural Failure
Sheikh, Muhammad, Elmarakbi, Mohab, Rehman, Sheikh, Elmarakbi, Ahmed
Published in Journal of the Electrochemical Society (01.03.2021)
Published in Journal of the Electrochemical Society (01.03.2021)
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Study of the Protection and Energy Transmission Modes of One Phase Short Circuit to Ground in Inverters
Chen, Dezhi, Zhang, Zhixiang, Zhang, Shichong, Sun, Yun, Zhao, Wenbo, Zhao, Wenliang
Published in Sensors (Basel, Switzerland) (30.09.2023)
Published in Sensors (Basel, Switzerland) (30.09.2023)
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Holmium laser enucleation of the prostate (HoLEP) in short‐circuit outpatient care: Is prostatic volume a limiting factor?
Maria, Sánchez Rodríguez, Franco, Marco, Freixa Sala, Roger, Gasanz Serrano, Carlos, Bernardello Ureta, Mauro, Bultó Gonzalvo, Ramón, Cervera Alcaide, Jordi, Casanova García, Carla, García Puche, Mireia, Segura Alabart, Maria, Areal Calama, Juan José, Ágreda Castañeda, Fernando
Published in Lower urinary tract symptoms (01.07.2024)
Published in Lower urinary tract symptoms (01.07.2024)
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Investigation of short-circuit failure mechanisms of SiC MOSFETs by varying DC bus voltage
Namai, Masaki, An, Junjie, Yano, Hiroshi, Iwamuro, Noriyuki
Published in Japanese Journal of Applied Physics (01.07.2018)
Published in Japanese Journal of Applied Physics (01.07.2018)
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Short-circuit robustness testing of SiC MOSFETs
Green, Ronald, Urciuoli, Damian P., Lelis, Aivars J.
Published in Materials science forum (15.05.2017)
Published in Materials science forum (15.05.2017)
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Detection Method for Inter-Turn Short Circuit Faults in Dry-Type Transformers Based on an Improved YOLOv8 Infrared Image Slicing-Aided Hyper-Inference Algorithm
Zhang, Zhaochuang, Xia, Jianhua, Wen, Yuchuan, Weng, Liting, Ma, Zuofu, Yang, Hekai, Yang, Haobo, Dou, Jinyao, Wang, Jingang, Zhao, Pengcheng
Published in Energies (Basel) (01.09.2024)
Published in Energies (Basel) (01.09.2024)
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Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence
Du, He, Diaz Reigosa, Paula, Ceccarelli, Lorenzo, Iannuzzo, Francesco
Published in IEEE journal of emerging and selected topics in power electronics (01.03.2020)
Published in IEEE journal of emerging and selected topics in power electronics (01.03.2020)
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