MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
CHERESHNYA ALEXANDER, SHKALIM ARIEL, MADMON RONEN, ORR YONATAN, BEN YACOV SHANI, OVECHKIN VLADIMIR
Year of Publication 21.09.2023
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Year of Publication 21.09.2023
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Processing of a scalar magnetometer signal contaminated by 1/f noise
Sheinker, Arie, Shkalim, Ariel, Salomonski, Nizan, Ginzburg, Boris, Frumkis, Lev, Kaplan, Ben-Zion
Published in Sensors and actuators. A. Physical. (20.07.2007)
Published in Sensors and actuators. A. Physical. (20.07.2007)
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패턴의 임계 치수 변동의 결정
BAL EVGENY, SHKALIM ARIEL, COHEN BOAZ, SCHWARZBAND ISHAI, KRIS ROMAN, VERESCHAGIN VADIM
Year of Publication 14.05.2020
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Year of Publication 14.05.2020
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METHOD OF GENERATING AN EXAMINATION RECIPE AND SYSTEM THEREOF
AMZALEG MOSHE, NEISTEIN EYAL, GESHEL MARK, SHKALIM ARIEL, TUBUL SHLOMO, COHEN ELAD
Year of Publication 20.03.2019
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Year of Publication 20.03.2019
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Processing of a scalar magnetometer signal contaminated by 1/ f α noise
Sheinker, Arie, Shkalim, Ariel, Salomonski, Nizan, Ginzburg, Boris, Frumkis, Lev, Kaplan, Ben-Zion
Published in Sensors and actuators. A. Physical. (01.07.2007)
Published in Sensors and actuators. A. Physical. (01.07.2007)
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Journal Article
Determining a critical dimension variation of a pattern
Vereschagin, Vadim, Cohen, Boaz, Kris, Roman, Shkalim, Ariel, Schwarzband, Ishai, Bal, Evgeny
Year of Publication 12.09.2023
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Year of Publication 12.09.2023
Patent
Mask inspection of a semiconductor specimen
Cohen, Boaz, Shkalim, Ariel, Chereshnya, Alexander, Cohen, Oren Shmuel, Ovechkin, Vladimir, Petel, Ori, Madmon, Ronen, Bal, Evgeny
Year of Publication 14.05.2024
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Year of Publication 14.05.2024
Patent
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
Vereschagin, Vadim, Cohen, Boaz, Kris, Roman, Shkalim, Ariel, Schwarzband, Ishai, Bal, Evgeny
Year of Publication 23.06.2022
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Year of Publication 23.06.2022
Patent
Determining a critical dimension variation of a pattern
Vereschagin, Vadim, Cohen, Boaz, Kris, Roman, Shkalim, Ariel, Schwarzband, Ishai, Bal, Evgeny
Year of Publication 15.03.2022
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Year of Publication 15.03.2022
Patent
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
MADMON, Ronen, BAL, Evgeny, PETEL, Ori, OVECHKIN, Vladimir, COHEN, Oren Shmuel, SHKALIM, Ariel, COHEN, Boaz, CHERESHNYA, Alexander
Year of Publication 11.08.2022
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Year of Publication 11.08.2022
Patent
Mask inspection of a semiconductor specimen
Cohen, Boaz, Shkalim, Ariel, Chereshnya, Alexander, Cohen, Oren Shmuel, Ovechkin, Vladimir, Petel, Ori, Madmon, Ronen, Bal, Evgeny
Year of Publication 31.05.2022
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Year of Publication 31.05.2022
Patent