Noble Gas Atoms Inside Fullerenes
Saunders, Martin, Cross, R. James, Jiménez-Vázquez, Hugo A., Shimshi, Rinat, Khong, Anthony
Published in Science (American Association for the Advancement of Science) (22.03.1996)
Published in Science (American Association for the Advancement of Science) (22.03.1996)
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Journal Article
Accurate Litho Model Tuning Using Design-Based Defect Binning
Vasek, J., Svidenko, V., Nehmadi, Y., Shimshi, R.
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)
Published in IEEE transactions on semiconductor manufacturing (01.08.2008)
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Journal Article
Identification of Process Window Limiting Structures by Design-Based Defect Binning
Vasek, J., Nehmadi, Y., Svidenko, V., Shimshi, R.
Published in 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.06.2007)
Published in 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.06.2007)
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Conference Proceeding
Dynamic defect-limited yield prediction by criticality factor
Svidenko, V., Shimshi, R., Nehmadi, Y.
Published in 2007 International Symposium on Semiconductor Manufacturing (01.10.2007)
Published in 2007 International Symposium on Semiconductor Manufacturing (01.10.2007)
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Conference Proceeding
Advanced SEM-based metrology of systematic defects
Lagus, M.E., Shimshi, R., Svidenko, V.
Published in ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005 (2005)
Published in ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005 (2005)
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Conference Proceeding
Method and apparatus for determining factors for design consideration in yield analysis
JAWAHARLAH SUNDAR, SVIDENKO VICKY, SCHWARM ALEXANDER T, SHIMSHI RINAT, NEHMADI YOUVAL
Year of Publication 30.12.2014
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Year of Publication 30.12.2014
Patent
Inline defect analysis for sampling and SPC
JAWAHARLAL SUNDAR, SVIDENKO VICKY, SCHWARM ALEXANDER T, SHIMSHI RINAT, NEHMADI YOUVAL
Year of Publication 05.08.2014
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Year of Publication 05.08.2014
Patent
Method and apparatus for robot calibrations with a calibrating device
SUNDAR SATISH, KRISHNASAMY SEKAR, FOLDENAUER DONALD, SHIMSHI RINAT, SAKHARE VIJAY, HUDGENS JEFFERY, FREEMAN MARVIN L, LESKA MORDECHAI
Year of Publication 01.04.2014
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Year of Publication 01.04.2014
Patent
Method and system for robot calibrations with a camera
Krishnasamy, Sekar, Sakhare, Vijay, Leska, Mordechai, Foldenauer, Donald, Shimshi, Rinat, Sundar, Satish
Year of Publication 04.09.2012
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Year of Publication 04.09.2012
Patent
Method and system for robot calibrations with a camera
SUNDAR SATISH, KRISHNASAMY SEKAR, FOLDENAUER DONALD, SHIMSHI RINAT, SAKHARE VIJAY, LESKA MORDECHAI
Year of Publication 04.09.2012
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Year of Publication 04.09.2012
Patent