by van Liempd, Barend, Ariumi, Saneaki, Martens, Ewout, Shih-Hung Chen, Wambacq, Piet, Craninckx, Jan
Published in ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC) (01.09.2015)

by Cai, Yi-Fu, Chen, Shih-Hung, Dent, James B, Dutta, Sourish, Saridakis, Emmanuel N
Published in Classical and quantum gravity (07.11.2011)

by Nian Wang, Shih-Hung Chen, Hellings, Geert, Myny, Kris, Steudel, Soeren, Scholz, Mirko, Boschke, Roman, Linten, Dimitri, Groeseneken, Guido
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)

by KER, Ming-Dou, CHEN, Shih-Hung
Published in IEEE journal of solid-state circuits (01.05.2007)

by Li, Yen-Yin, Lee, Yin-Wen, Ho, Tuan-Shu, Wei, Rong-Tz, Lai, Po-Yen, Jao, Kao-Sheng, Wu, I-Chou, Chen, Shih-Hung, Huang, Sheng-Lung
Published in IEEE photonics journal (01.08.2017)

by Boschke, Roman, Shih-Hung Chen, Scholz, Mirko, Hellings, Geert, Linten, Dimitri, Witters, Liesbeth, Collaert, Nadine, Groeseneken, Guido
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)

by Griffoni, A, Shih-Hung Chen, Thijs, S, Kaczer, B, Franco, J, Linten, D, De Keersgieter, A, Groeseneken, G
Published in IEEE transactions on electron devices (01.07.2011)

by Chen, Wen-Chieh, Chen, Shih-Hung, Chiarella, Thomas, Hellings, Geert, Linten, Dimitri, Groeseneken, Guido
Published in IEEE transactions on electron devices (01.09.2022)

by Chen, Shih-Hung, Ker, Ming-Dou
Published in IEEE transactions on circuits and systems. II, Express briefs (01.05.2009)

by Su, Fengsheng, Lu, Chungsying, Chen, Hung-Shih
Published in Langmuir (05.07.2011)

by Shih-Hung Chen, Yueh-Chin Lin, Linten, D., Scholz, M., Hellings, G., Chang, E. Y., Groeseneken, G.
Published in IEEE electron device letters (01.09.2012)

by Kuramitsu, Yasuhiro, Sakawa, Youich, Hoshino, Masahiro, Chen, Shih-Hung, Takabe, Hideaki
Published in High energy density physics (01.09.2012)

by Boschke, Roman, Shih-Hung Chen, Hellings, Geert, Scholz, Mirko, De Heyn, Peter, Verheyen, Peter, van Campenhout, Joris, Linten, Dimitri, Thean, Aaron, Groeseneken, Guido
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)

by Tsai, Wen-Shing, Lu, Hai-Han, Chen, Shih-Hung, Chien, Tzu-Shen, Chen, Wei-Nien, Tu, Mien-Hsian
Published in IEEE photonics technology letters (01.10.2005)

by Simicic, Marko, Ashif, Nowab Reza, Hellings, Geert, Chen, Shih-Hung, Nag, Manoj, Kronemeijer, Auke Jisk, Myny, Kris, Linten, Dimitri
Published in Microelectronics and reliability (01.05.2020)

by Sandupatla, Abhinay, Chen, Shih-Hung, Mane, Nikhil, Parvais, Bertrand, Yu, Hao, Pradhan, Nilam, Collaert, Nadine
Published in 2023 45th Annual EOS/ESD Symposium (EOS/ESD) (02.10.2023)

by Simicic, Marko, Gijbels, Frank, Iacovo, Serena, Chen, Shih-Hung, Van Der Plas, Geert, Beyne, Eric
Published in 2023 45th Annual EOS/ESD Symposium (EOS/ESD) (02.10.2023)

by Lai, Po-Yen, Chang, Chun-Lin, Huang, Sheng-Lung, Chen, Shih-Hung
Published in Applied optics. Optical technology and biomedical optics (01.05.2018)

by Lin, Shih-Hsiang, Simicic, Marko, Pantano, Nicolas, Chen, Shih-Hung, Roussel, Philippe, Van Der Plas, Geert, Beyne, Eric, Wambacq, Piet
Published in 2023 45th Annual EOS/ESD Symposium (EOS/ESD) (02.10.2023)

by Yeh, Yen Liang, Chen, Bin-Hao, Chen, Shih Hung, Lee, Chun Te
Published in Sensors and materials (01.01.2022)