Polarity Change of Threshold Voltage Shifts for n-channel Polycrystalline Silicon Thin-Film Transistors Stressed by Negative Gate Bias
Huang, Ching-Fang, Yang, Ying-Jhe, Peng, Cheng-Yi, Sun, Hung-Chang, Liu, Chee Wee, Hsu, Yuan-Chun, Shih, Ching-Chien, Chen, Jim-Shone
Published in ECS transactions (2009)
Published in ECS transactions (2009)
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Journal Article
Polarity Change of Threshold Voltage Shifts for n-channel Polycrystalline Silicon Thin-Film Transistors Stressed by Negative Gate Bias
Huang, Ching-Fang, Yang, Ying-Jhe, Peng, Cheng-Yi, Sun, Hung-Chang, Liu, Chee Wee, Hsu, Yuan-Chun, Shih, Ching-Chien, Lin, Kun-Chih
Published in Meeting abstracts (Electrochemical Society) (29.08.2008)
Published in Meeting abstracts (Electrochemical Society) (29.08.2008)
Get full text
Journal Article