A new methodology for assessment of the susceptibility to data retention in floating gate non-volatile memories
Chih-Ching Shih, Ming-Yi Lee, Shaw-Hung Ku, Lien-Feng Lee, Li-Kuang Kuo, Wen-Jer Tsai, Lin, D. J., Wen-Pin Lu, Tao-Chen Lu, Kuang-Chao Chen, Yen-Hie Chao, Chih-Yuan Lu
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Resistance switching characteristics in polycrystalline silicon film resistors
Lu, Chih‐Yuan, Lu, Nicky Chau‐Chun, Shih, Chih‐Ching
Published in Journal of the Electrochemical Society (01.05.1985)
Published in Journal of the Electrochemical Society (01.05.1985)
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Journal Article