Depression of auditory cortex excitability by transcranial alternating current stimulation
Wang, Yao, Dong, Gaoyuan, Shi, Limeng, Yang, Tianshun, Chen, Ruijuan, Wang, Huiquan, Han, Guang
Published in Neuroscience letters (18.01.2021)
Published in Neuroscience letters (18.01.2021)
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Journal Article
Modeling of Charge-to-Breakdown with an Electron Trapping Model for Analysis of Thermal Gate Oxide Failure Mechanism in SiC Power MOSFETs
Qian, Jiashu, Shi, Limeng, Jin, Michael, Bhattacharya, Monikuntala, Shimbori, Atsushi, Yu, Hengyu, Houshmand, Shiva, White, Marvin H, Agarwal, Anant K
Published in Materials (01.04.2024)
Published in Materials (01.04.2024)
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Journal Article
The Road to a Robust and Affordable SiC Power MOSFET Technology
Maddi, Hema Lata Rao, Yu, Susanna, Zhu, Shengnan, Liu, Tianshi, Shi, Limeng, Kang, Minseok, Xing, Diang, Nayak, Suvendu, White, Marvin H., Agarwal, Anant K.
Published in Energies (Basel) (01.12.2021)
Published in Energies (Basel) (01.12.2021)
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Journal Article
Effects of Transcranial Electrical Stimulation on Human Auditory Processing and Behavior—A Review
Wang, Yao, Shi, Limeng, Dong, Gaoyuan, Zhang, Zuoying, Chen, Ruijuan
Published in Brain sciences (08.08.2020)
Published in Brain sciences (08.08.2020)
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Journal Article
An Investigation of Body Diode Reliability in Commercial 1.2 kV SiC Power MOSFETs with Planar and Trench Structures
Qian, Jiashu, Shi, Limeng, Jin, Michael, Bhattacharya, Monikuntala, Shimbori, Atsushi, Yu, Hengyu, Houshmand, Shiva, White, Marvin H, Agarwal, Anant K
Published in Micromachines (Basel) (25.01.2024)
Published in Micromachines (Basel) (25.01.2024)
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Journal Article
Operational Risk Aggregation Based on Business Line Dependence: A Mutual Information Approach
Wang, Wenzhou, Zhu, Xiaoqian, Shi, Limeng
Published in Discrete dynamics in nature and society (01.01.2016)
Published in Discrete dynamics in nature and society (01.01.2016)
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Journal Article
Excitability changes induced in the human auditory cortex by transcranial alternating current stimulation
Wang, Yao, Zhang, Yue, Hou, Peiyun, Dong, Gaoyuan, Shi, Limeng, Li, Weiming, Wei, Ran, Li, Xiaojie
Published in Neuroscience letters (01.01.2023)
Published in Neuroscience letters (01.01.2023)
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Journal Article
Characterization and Analysis of Degradation for 1.2-kV Rated SiC Trench MOSFETs Under Repetitive Switching Impulses
Yu, Hengyu, Jin, Michael, Bhardwaj, Nikhil, Shi, Limeng, Bhattacharya, Monikuntala, Qian, Jiashu, Houshmand, Shiva, Agarwal, Anant K.
Published in IEEE transactions on electron devices (13.09.2024)
Published in IEEE transactions on electron devices (13.09.2024)
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Journal Article
Investigation on gate oxide reliability under gate bias screening for commercial SiC planar and trench MOSFETs
Shi, Limeng, Qian, Jiashu, Jin, Michael, Bhattacharya, Monikuntala, Yu, Hengyu, Shimbori, Atsushi, White, Marvin H., Agarwal, Anant K.
Published in Materials science in semiconductor processing (01.05.2024)
Published in Materials science in semiconductor processing (01.05.2024)
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Journal Article
Non-isothermal simulation of SiC DMOSFET short circuit capability
Nayak, Suvendu, Yu, Susanna, Maddi, Hema Lata Rao, Jin, Michael, Shi, Limeng, Ganguly, Swaroop, Agarwal, Anant K.
Published in Japanese Journal of Applied Physics (01.06.2022)
Published in Japanese Journal of Applied Physics (01.06.2022)
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Journal Article
Effects of Transcranial Electrical Stimulation on Human Auditory Processing and Behavior--A Review
Wang, Yao, Shi, Limeng, Dong, Gaoyuan, Zhang, Zuoying, Chen, Ruijuan
Published in Brain sciences (01.08.2020)
Published in Brain sciences (01.08.2020)
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Journal Article
Evaluation of Burn-in Technique on Gate Oxide Reliability in Commercial SiC MOSFETs
Shi, Limeng, Qian, Jiashu, Jin, Michael, Bhattacharya, Monikuntala, Yu, Hengyu, White, Marvin H., Agarwal, Anant K., Shimbori, Atsushi
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Investigation of the Electron Trapping in Commercial Thick Silicon Dioxides Thermally Grown on 4H-SiC under the Constant Current Stress
Qian, Jiashu, Shi, Limeng, Jin, Michael, Bhattacharya, Monikuntala, Yu, Hengyu, White, Marvin H., Agarwal, Anant K., Shimbori, Atsushi, Liu, Tianshi, Zhu, Shengnan
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs
Shi, Limeng, Zhu, Shengnan, Qian, Jiashu, Jin, Michael, Bhattacharya, Monikuntala, White, Marvin H., Agarwal, Anant K., Shimbori, Atsushi, Liu, Tianshi
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs
Zhu, Shengnan, Shi, Limeng, Jin, Michael, Qian, Jiashu, Bhattacharya, Monikuntala, Rao Maddi, Hema Lata, White, Marvin H., Agarwal, Anant K., Liu, Tianshi, Shimbori, Atsushi, Chen, Chingchi
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Effects of Oxide Electric Field Stress on the Gate Oxide Reliability of Commercial SiC Power MOSFETs
Shi, Limeng, Liu, Tianshi, Zhu, Shengnan, Qian, Jiashu, Jin, Michael, Maddi, Hema Lata Rao, White, Marvin H., Agarwal, Anant K.
Published in 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) (07.11.2022)
Published in 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) (07.11.2022)
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Conference Proceeding
Impacts of Area-Dependent Defects on the Yield and Gate Oxide Reliability of SiC Power MOSFETs
Liu, Tianshi, Zhu, Shengnan, Jin, Michael, Shi, Limeng, White, Marvin H., Agarwal, Anant K.
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
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Conference Proceeding
Comparison of Gate Oxide Lifetime Predictions with Charge-to-Breakdown Approach and Constant-Voltage TDDB on SiC Power MOSFET
Zhu, Shengnan, Liu, Tianshi, Shi, Limeng, Jin, Michael, Maddi, Hema Lata Rao, White, Marvin H., Agarwal, Anant K.
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
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Conference Proceeding
A Comparison of Ion Implantation at Room Temperature and Heated Ion Implantation on the Body Diode Degradation of Commercial 3.3 kV 4H-SiC Power MOSFETs
Qian, Jiashu, Liu, Tianshi, Soto, Jake, Al-Jassim, Mowafak M., Stahlbush, Robert, Mahadik, Nadeemullah, Shi, Limeng, Jin, Michael, Agarwal, Anant K.
Published in 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) (07.11.2022)
Published in 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) (07.11.2022)
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Conference Proceeding