Ti/HfO2 Based RRAM Operation Voltage Scaling for Embedded Memory
Tsai, C.H., Chen, F. T., Lee, H.Y., Chen, Y.S., Tsai, K.H., Wu, T.Y., Rahaman, S.Z., Gu, P.Y., Chen, W. S., Chen, P.S., Lin, Z.H., Tseng, P.L., Lin, W.P., Lin, C.H., Sheu, S.S., Tsai, M. J., Ku, T.K.
Published in ECS transactions (01.01.2013)
Published in ECS transactions (01.01.2013)
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Journal Article
Highly scalable hafnium oxide memory with improvements of resistive distribution and read disturb immunity
Chen, Y.S., Lee, H.Y., Chen, P.S., Gu, P.Y., Chen, C.W., Lin, W.P., Liu, W.H., Hsu, Y.Y., Sheu, S.S., Chiang, P.C., Chen, W.S., Chen, F.T., Lien, C.H., Tsai, M.-J.
Published in 2009 IEEE International Electron Devices Meeting (IEDM) (01.12.2009)
Published in 2009 IEEE International Electron Devices Meeting (IEDM) (01.12.2009)
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Conference Proceeding
Bioavailability to quail of zinc in salts, food additives and supplements for humans
Tao, S.H, Sheu, S.S, Johnson, M.L, Fry, B.E. Jr, Spivey Fox, M.R
Published in Trace substances in environmental health; proceedings of University of Missouri's ... annual conference (USA) (1980)
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Published in Trace substances in environmental health; proceedings of University of Missouri's ... annual conference (USA) (1980)
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