Characterization and performance of germanium detectors with sub-keV sensitivities for neutrino and dark matter experiments
Soma, A.K., Singh, M.K., Singh, L., Kumar, G. Kiran, Lin, F.K., Du, Q., Jiang, H., Liu, S.K., Ma, J.L., Sharma, V., Wang, L., Wu, Y.C., Yang, L.T., Zhao, W., Agartioglu, M., Asryan, G., Chang, Y.Y., Chen, J.H., Chuang, Y.C., Deniz, M., Hsu, C.L., Hsu, Y.H., Huang, T.R., Jia, L.P., Kerman, S., Li, H.B., Li, J., Liao, F.T., Liao, H.Y., Lin, C.W., Lin, S.T., Marian, V., Ruan, X.C., Sevda, B., Shen, Y.T., Singh, M.K., Singh, V., Sonay, A., Su, J., Subrahmanyam, V.S., Tseng, C.H., Wang, J.J., Wong, H.T., Xu, Y., Yang, S.W., Yu, C.X., Yue, Q., Zeyrek, M.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.11.2016)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (11.11.2016)
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Journal Article
Differentiation of bulk and surface events in p-type point-contact germanium detectors for light WIMP searches
Li, H.B., Singh, L., Singh, M.K., Soma, A.K., Tseng, C.H., Yang, S.W., Agartioglu, M., Asryan, G., Chuang, Y.C., Deniz, M., Huang, T.R., Kiran Kumar, G., Li, J., Liao, H.Y., Lin, F.K., Lin, S.T., Liu, S.K., Sharma, V., Shen, Y.T., Singh, V., Wong, H.T., Wu, Y.C., Xu, Y., Yu, C.X., Yue, Q., Zhao, W.
Published in Astroparticle physics (01.04.2014)
Published in Astroparticle physics (01.04.2014)
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Journal Article
Complementary Field-Effect Transistor (CFET) Demonstration at 48nm Gate Pitch for Future Logic Technology Scaling
Liao, S., Yang, L., Chiu, T.K., You, W.X., Wu, T.Y., Yang, K.F., Woon, W.Y., Ho, W.D., Lin, Z.C., Hung, H.Y., Huang, J.C., Huang, S.T., Tsai, M.C., Yu, C.L., Chen, S.H., Hu, K.K., Shih, C.C., Chen, Y.T., Liu, C.Y., Lin, H.Y., Chung, C.T., Su, L., Chou, C.Y., Shen, Y.T., Chang, C.M., Lin, Y.T., Lin, M.Y., Lin, W.C., Chen, B.H., Hou, C.S., Lai, F., Chen, X., Wu, J., Lin, C.K., Cheng, Y.K., Lin, H.T., Ku, Y.C., Lin, S.S., Lu, L.C., Jang, S.M., Cao, M.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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