A high-density logic CMOS process compatible non-volatile memory for sub-28nm technologies
Shen, Rick Shih-Jye, Meng-Yi Wu, Hsin-Ming Chen, Lu, Chris Chun-Hung
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
A PUF scheme using competing oxide rupture with bit error rate approaching zero
Meng-Yi Wu, Tsao-Hsin Yang, Lun-Chun Chen, Chi-Chang Lin, Hao-Chun Hu, Fang-Ying Su, Chih-Min Wang, Huang, James Po-Hao, Hsin-Ming Chen, Lu, Chris Chun-Hung, Yang, Evans Ching-Sung, Shen, Rick Shih-Jye
Published in 2018 IEEE International Solid - State Circuits Conference - (ISSCC) (01.02.2018)
Published in 2018 IEEE International Solid - State Circuits Conference - (ISSCC) (01.02.2018)
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Conference Proceeding
Performance and reliability trade-off of large-tilted-angle implant P-pocket on stacked-gate memory devices
SHEN, S.-J, CHEN, H.-M, LIN, C.-J, CHEN, H.-H, HONG, G, HSU, C. C.-H
Published in Japanese Journal of Applied Physics (01.07.1997)
Published in Japanese Journal of Applied Physics (01.07.1997)
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Journal Article
Degradation of Flash Memory Using Drain-Avalanche Hot Electron (DAHE) Self-Convergence Operation Scheme
Shen, Shih-Jye, Yang, Evans Ching-Song, Wong, Wei-Jer, Wang, Yen-Sen, Lin, Chrong-Jung, Liang, Mong-Song, Hsu, Charles Ching-Hsiang
Published in Japanese Journal of Applied Physics (01.07.1998)
Published in Japanese Journal of Applied Physics (01.07.1998)
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Journal Article
Future Prospective of Programmable Logic Non-Volatile Device
Ching-Hsiang Hsu, C., Yen-Tai Lin, Shih-Jye Shen
Published in 2006 IEEE Asian Solid-State Circuits Conference (01.11.2006)
Published in 2006 IEEE Asian Solid-State Circuits Conference (01.11.2006)
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Conference Proceeding