Electronic structure theory and mechanisms of the oxide trapped hole annealing process
Karna, S.P., Pineda, A.C., Pugh, R.D., Shedd, W.M., Oldham, T.R.
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
The Impact of Total Ionizing Dose on Unhardened SRAM Cell Margins
Xiaoyin Yao, Hindman, N., Clark, L.T., Holbert, K.E., Alexander, D.R., Shedd, W.M.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Dose Rate Upset Investigations on the Xilinx Virtex IV Field Programmable Gate Arrays
Vera, A., Llamocca, D., Pattichis, M., Kemp, W., Shedd, W., Alexander, D., Lyke, J.
Published in 2007 IEEE Radiation Effects Data Workshop (01.07.2007)
Published in 2007 IEEE Radiation Effects Data Workshop (01.07.2007)
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Conference Proceeding
Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations
Vera, A., Llamocca, D., Fabula, J., Kemp, W., Marquez, R., Shedd, W., Alexander, D.
Published in 2008 IEEE Radiation Effects Data Workshop (01.07.2008)
Published in 2008 IEEE Radiation Effects Data Workshop (01.07.2008)
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Conference Proceeding
The effect of network topology on proton trapping in amorphous SiO 2
Pineda, A C, Karna, S P, Kurtz, H A, Shedd, W M, Pugh, R D
Published in IEEE transactions on nuclear science (01.12.2001)
Published in IEEE transactions on nuclear science (01.12.2001)
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Journal Article
Microscopic mechanisms of electron trapping by self-trapped holes and protons in amorphous SiO2
Kama, S.P, Kurtz, H.A, Shedd, W.M, Pugh, R.D
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
Interaction of H+/H0 with O atoms in thin SiO2 films : a first-principles quantum mechanical study
KARNA, S. P, PUGH, R. D, SHEDD, W. M, SINGARAJU, B. B. K
Published in Journal of non-crystalline solids (01.09.1999)
Published in Journal of non-crystalline solids (01.09.1999)
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Conference Proceeding
Journal Article
Heavy Ion Testing of Commercial GaN Transistors in the Radio Frequency Spectrum
Armstrong, Sarah E., Bole, Ken, Bradley, Holly, Johnson, Ethan, Staggs, James, Shedd, Walter, Cole, Patrick L., Rice, Casey H., Ingalls, J. David, Hedge, Casey C., Duncan, Adam R., Olson, Brian D.
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding
SOS Device radiation effects and hardening
Buchanan, B.L., Neamen, D.A., Shedd, W.M.
Published in IEEE transactions on electron devices (01.08.1978)
Published in IEEE transactions on electron devices (01.08.1978)
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Journal Article
SCHOTTKY BARRIER INFRARED DETECTOR ARRAYS WITH CHARGE COUPLED DEVICE READOUT
YANG; ANDREW C, ROOSILD; SVEN A, SHEDD; WALTER M, SHEPHERD, JR.; FREEMAN D
Year of Publication 26.08.1975
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Year of Publication 26.08.1975
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