by Shavdina, O, Berthod, L, Kämpfe, T, Reynaud, S, Veillas, C, Verrier, I, Langlet, M, Vocanson, F, Fugier, P, Jourlin, Y, Dellea, O
Published in Langmuir (21.07.2015)

by Berthod, L., Shavdina, O., Vocanson, F., Langlet, M., Dellea, O., Veillas, C., Reynaud, S., Verrier, I., Jourlin, Y.
Published in Microelectronic engineering (05.06.2017)

by Berthod, L, Shavdina, O, Vocanson, F, Langlet, M, Dellea, O, Veillas, C, Reynaud, S, Verrier, I, Jourlin, Y
Published in Microelectronic engineering (05.06.2017)

by Berthod, L., Shavdina, O., Vocanson, F., Langlet, M., Dellea, O., Veillas, C., Reynaud, S., Verrier, I., Jourlin, Y.
Published in Microelectronic engineering (01.06.2017)

by Shavdina, O., Berthod, L., Kämpfe, T., Reynaud, S., Veillas, C., Verrier, I., Langlet, M., Vocanson, F., Fugier, P., Jourlin, Y., Dellea, O.
Published in Langmuir (21.07.2015)

by Shcherbakov, A.A., Shavdina, O., Tishchenko, A.V., Veillas, C., Verrier, I., Dellea, O., Jourlin, Y.
Published in Journal of quantitative spectroscopy & radiative transfer (01.03.2017)