Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon, Rao, Siddharth, Kundu, Shreya, Kim, Woojin, O'Sullivan, Barry J., Cosemans, Stefan, Yasin, Farukh, Carpenter, Robert, Couet, Sebastien, Sharifi, Shamin H., Jossart, Nico, Crotti, Davide, Kar, Gouri
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
La Doped HZO-Based 3D-Trench Metal-Ferroelectric-Metal Capacitors With High-Endurance (>10¹²) for FeRAM Applications
Walke, Amey M., Popovici, Mihaela I., Sharifi, Shamin H., Demir, Eyup C., Puliyalil, Harinarayanan, Bizindavyi, Jasper, Yasin, Farrukh, Clima, Sergiu, Fantini, Andrea, Belmonte, Attilio, Kar, Gouri S., Houdt, Jan V.
Published in IEEE electron device letters (01.04.2024)
Published in IEEE electron device letters (01.04.2024)
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Journal Article
10¹²) for FeRAM Applications
Walke, Amey M, Popovici, Mihaela I, Sharifi, Shamin H, Demir, Eyup C, Harinarayanan Puliyalil, Bizindavyi, Jasper, Yasin, Farrukh, Clima, Sergiu, Fantini, Andrea, Belmonte, Attilio, Kar, Gouri S, Houdt, Jan V
Published in IEEE electron device letters (01.01.2024)
Published in IEEE electron device letters (01.01.2024)
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Journal Article