by Lusky, E., Shacham-Diamand, Y., Mitenberg, G., Shappir, A., Bloom, I., Eitan, B.
Published in IEEE transactions on electron devices (01.03.2004)

by Shappir, Assaf, Levy, David, Shacham-Diamand, Yosi, Lusky, Eli, Bloom, Ilan, Eitan, Boaz
Published in Solid-state electronics (01.09.2004)

by Shappir, Assaf, Shacham-Diamand, Yosi, Lusky, Eli, Bloom, Ilan, Eitan, Boaz
Published in Microelectronic engineering (01.04.2004)

by Janai, M., Shappir, A., Bloom, I., Eitan, B.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)

by Shappir, Assaf, Shacham-Diamand, Yosi, Lusky, Eli, Bloom, Ilan, Eitan, Boaz
Published in Solid-state electronics (01.05.2003)

by Shappir, A., Levy, D., Geva, G., Shacham-Diamand, Y., Lusky, E., Bloom, I., Eitan, B.
Published in The 22nd Convention on Electrical and Electronics Engineers in Israel, 2002 (2002)

by Janai, M., Eitan, B., Shappir, A., Lusky, E., Bloom, I., Cohen, G.
Published in IEEE transactions on device and materials reliability (01.09.2004)

by Lusky, E., Shacham-Diamand, Y., Shappir, A., Bloom, I., Cohen, G., Eitan, B.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Bloom, I., Luski, E., Shappir, A., Janai, M., Eitan, B.
Published in Encyclopedia of Materials: Science and Technology (2011)

by Shappir, A., Litsky, E., Cohen, G., Eitan, B.
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)

by Yael Shur, Shacham-Diamand, Y., Lusky, E., Eitair, B., Shappir, A.
Published in 2006 IEEE 24th Convention of Electrical & Electronics Engineers in Israel (01.11.2006)

by Eitan, B., Cohen, G., Shappir, A., Eli Lusky, Givant, A., Janai, M., Bloom, I., Polansky, Y., Dadashev, O., Lavan, A., Sahar, R., Maayan, E.
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)

by Nagel, N., Boubekeur, H., Heinrichsdorff, F., Bach, L., Polei, V., Gupta, J., Pritchard, D., Riedel, S., Strassburg, M., Deppe, J., Bewersdorff-Sarlette, U., Muller, T., Verhoeven, M., Lattard, L., Markert, M., Ruttkowski, E., Mikalo, R., Willer, J., Schulze, N., Ludwig, C., v. Kamienski, E.G. Stein, Mikolajick, T., Isler, M., Kusters, K.-H., Shappir, A., Shur, Y., Lusky, E., Eitan, B., Pissors, V., Sachse, J.-U., Manger, D., Caspary, D., Parascandola, S., Olligs, D.
Published in 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2007)

by SHAPPIR, ASSAF
Year of Publication 01.03.2005

by SHAPPIR JOSEPH, BEN-YOSEF NISSIM, LEVY URIEL
Year of Publication 15.06.2011

by SHAPPIR ASSAF, IRANI RUSTOM, EITAN BOAZ
Year of Publication 04.05.2011

by SHAPPIR JOSEPH, BENYOSEF NISSIM, LEVY URIEL
Year of Publication 07.04.2011