Comparison of single-event upset generated by heavy ion and pulsed laser
Liang, Bin, Song, Ruiqiang, Han, Jianwei, Chi, Yaqing, Chen, Rui, Hu, Chunmei, Chen, Jianjun, Ma, Yingqi, Shangguan, Shipeng
Published in Science China. Information sciences (01.07.2017)
Published in Science China. Information sciences (01.07.2017)
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Journal Article
SEE Characteristics of COTS Devices by 1064nm Pulsed Laser Backside Testing
Ma Yingqi, Han Jianwei, Shangguan ShiPeng, Chen Rui, Zhu Xiang, Li Yue, Zhan Yueying
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding
Single event effects of SiC diode demonstrated by pulsed-laser two photon absorption
Shangguan, ShiPeng, Ma, YingQi, Han, JianWei, Cui, YiXin, Wang, YingHao, Chen, Rui, Liang, YaNan, Zhu, Xiang, Li, Yue
Published in Microelectronics and reliability (01.10.2021)
Published in Microelectronics and reliability (01.10.2021)
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Journal Article
Study on the Key Influencing Factors of Single-Event-Upset Sensitivity in 65nm CMOS Sequencing Logic Circuit
Sai, LI, Rui, CHEN, Jianwei, HAN, YingQi, MA, ShiPeng, SHANGGUAN, Xiang, ZHU, Yue, LI
Published in 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) (01.05.2018)
Published in 2018 International Conference on Radiation Effects of Electronic Devices (ICREED) (01.05.2018)
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Conference Proceeding
Comparison of radiation-induced charge sharing generated by heavy ion and pulsed laser
Song Ruiqiang, Chen Shuming, Han Jianwei, Chi Yaqing, Chen Rui, Liang Bin, Huang Pengcheng, Ma Yingqi, Shangguan Shipeng
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
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Conference Proceeding
Comparative Study on the “Soft Errors” Induced by Single-Event Effect and Space Electrostatic Discharge
Chen, Rui, Chen, Li, Han, Jianwei, Wang, Xuan, Liang, Yanan, Ma, Yingqi, Shangguan, Shipeng
Published in Electronics (Basel) (01.04.2021)
Published in Electronics (Basel) (01.04.2021)
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Journal Article
Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation
Liu, Shuhuan, Du, Xuecheng, Du, Xiaozhi, Zhang, Yao, Mubashiru, Lawal Olarewaju, Luo, Dongyang, yuan, Yuan, Deng, Tianxiang, Li, Zhuoqi, Zang, Hang, Li, Yonghong, He, Chaohui, Ma, Yingqi, Shangguan, Shipeng
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.09.2017)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.09.2017)
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Journal Article
Laser-Induced Micro SEL Characterization of SRAM Devices
Yingqi, Ma, Jianwei, Han, Shipeng, Shangguan, Xiang, Zhu, Rui, Chen
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
Published in 2019 IEEE Radiation Effects Data Workshop (01.07.2019)
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Conference Proceeding
FAILURE POSITION SYSTEM AND METHOD FOR INTEGRATED CIRCUIT BASED ON CONTINUOUS LASER SOURCE
LIANG, YA'NAN, CHEN, RUI, MA, YINGQI, YANG HAN, HAN, JIANWEI, ZHU, XIANG, CHEN, QIAN, SHANGGUAN, SHIPENG
Year of Publication 27.03.2024
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Year of Publication 27.03.2024
Patent
FAILURE POSITION SYSTEM AND METHOD FOR INTEGRATED CIRCUIT BASED ON CONTINUOUS LASER SOURCE
LIANG, YA'NAN, CHEN, RUI, MA, YINGQI, YANG HAN, HAN, JIANWEI, ZHU, XIANG, CHEN, QIAN, SHANGGUAN, SHIPENG
Year of Publication 08.11.2023
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Year of Publication 08.11.2023
Patent
Self-adaptive steering control crawler-type chassis system and control method thereof
SUN QIYOU, SHANGGUAN SHIPENG, XU JIKANG, LI RUICHUAN, WANG DONGWEI, WANG JIASHENG, ZHANG NING, LI JIANG, LI YANCHAO
Year of Publication 19.07.2024
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Year of Publication 19.07.2024
Patent
SYSTEM AND METHOD FOR INTEGRATED CIRCUIT FAILURE POSITIONING BASED ON CONTINUOUS LASER SOURCE
ZHU, Xiang, HAN, Jianwei, YANG, Han, SHANGGUAN, Shipeng, CHEN, Rui, CHEN, Qian, LIANG, Ya'nan, MA, Yingqi
Year of Publication 29.06.2023
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Year of Publication 29.06.2023
Patent
Optical measurement method used for material thickness of semiconductor device
MA YINGQI, SHANGGUAN SHIPENG, HAN JIANWEI, ZHU XIANG, CHEN RUI, FENG GUOQIANG
Year of Publication 09.12.2015
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Year of Publication 09.12.2015
Patent