On the adsorption sites for CO on the Rh(111) single crystal surface
Beutler, A., Lundgren, E., Nyholm, R., Andersen, J.N., Setlik, B., Heskett, D.
Published in Surface science (01.02.1997)
Published in Surface science (01.02.1997)
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Journal Article
An optical microscopy imaging method for detection of electromigration-induced damage
Li, L.H., Piecuch, C., Hiatt, J., Setlik, B., Heskett, D.
Published in Microelectronic engineering (01.09.2004)
Published in Microelectronic engineering (01.09.2004)
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Journal Article
Adsorption sites in coadsorption systems determined by photoemission spectroscopy: K and CO coadsorbed on Rh(111)
Strisland, F, Beutler, A, Jaworowski, A.J, Nyholm, R, Setlik, B, Heskett, D, Andersen, J.N
Published in Surface science (01.08.1998)
Published in Surface science (01.08.1998)
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Journal Article
Electromigration investigations of aluminum alloy interconnects
Setlik, B., Heskett, D., Aubin, K., Briere, M.A.
Published in Proceedings of the UGIM Symposium, Microelectronics Education for the Future. Twelfth Biennial University/Government/Industry Microelectronics Symposium (Cat. No.97CH36030) (1997)
Published in Proceedings of the UGIM Symposium, Microelectronics Education for the Future. Twelfth Biennial University/Government/Industry Microelectronics Symposium (Cat. No.97CH36030) (1997)
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