Robustness improvement of an SRAM cell against laser-induced fault injection
Sarafianos, Alexandre, Lisart, Mathieu, Gagliano, Olivier, Serradeil, Valerie, Roscian, Cyril, Dutertre, Jean-Max, Tria, Assia
Published in 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (01.10.2013)
Published in 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (01.10.2013)
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Conference Proceeding
Direct electrical transport measurement on a single thermoelectric nanowire embedded in an alumina templateElectronic supplementary information (ESI) available. See DOI: 10.1039/c6cp00972g
Ben Khedim, Meriam, Cagnon, Laurent, Garagnon, Christophe, Serradeil, Valerie, Bourgault, Daniel
Year of Publication 28.04.2016
Year of Publication 28.04.2016
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Journal Article
Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology
Sarafianos, A., Gagliano, O., Serradeil, V., Lisart, M., Dutertre, J-M, Tria, A.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Approaches to Simulating Meta-surfaces for Flat Optical Devices: The Transition to Solutions Based on Neural Networks
Rideau, Denis, Le Grand, Mathys, Mouron, Louis Henri Fernandez, Serradeil, Valerie, Tremas, Loumi, Urard, Pascal, Maitre, Damien, Mohamad, Habib, Dilhan, Lucie, Carnemolla, Enrico Giuseppe, Fissore, Matteo, Downing, James, Rae, Bruce
Published in 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (24.09.2024)
Published in 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (24.09.2024)
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Conference Proceeding
Building the electrical model of the pulsed photoelectric laser stimulation of a PMOS transistor in 90nm technology
Sarafianos, Alexandre, Gagliano, Olivier, Lisart, Mathieu, Serradeil, Valerie, Dutertre, Jean-Max, Tria, Assia
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding
Building the electricalmodel of the PhotoelectricLaserStimulation of a PMOS transistor in 90 nm technology
Sarafianos, Alexandre, Llido, Roxane, Dutertre, Jean-Max, Gagliano, Olivier, Serradeil, Valérie, Lisart, Mathieu, Goubier, Vincent, Tria, Assia, Pouget, Vincent, Lewis, Dean
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Journal Article