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Virtual Digital Electronics Engineering Laboratory for Online learning after COVID19
Thakor, Asifiqbal, Khant, Shailesh
Published in Proceedings (International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (14.03.2024)
Published in Proceedings (International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (14.03.2024)
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Conference Proceeding
Altera Max Plus II Development Environment in Fault Simulation and Test Implementation of Embedded: Cores-Based Sequential Circuits
Das, Sunil R., Jin, Chuan, Jin, Liwu, Assaf, Mansour H., Petriu, Emil M., Sahinoglu, Mehmet
Published in Distributed Computing - IWDC 2004 (01.01.2004)
Published in Distributed Computing - IWDC 2004 (01.01.2004)
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Book Chapter
Optimal clock period clustering for sequential circuits with retiming
Pan, P., Karandikar, A.K., Liu, C.L.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.1998)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.1998)
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Journal Article
Leakage current reduction in CMOS VLSI circuits by input vector control
Abdollahi, A., Fallah, F., Pedram, M.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2004)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2004)
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Journal Article
Pseudo-exhaustive built-in TPG for sequential circuits
Kagaris, D., Tragoudas, S., Bhatia, D.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.1995)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.1995)
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Journal Article
Fault Tolerant Control for Spaceborne Dual Ring Counters with Selective Overriding
Yang, Jung-Min, Jung, Im Y., Kwak, Seong Woo
Published in Indian journal of science and technology (01.01.2015)
Published in Indian journal of science and technology (01.01.2015)
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Journal Article
Sequential circuits test generation using GTL
He Xinhua, Zhao Yingkun
Published in 2011 International Conference on Electric Information and Control Engineering (01.04.2011)
Published in 2011 International Conference on Electric Information and Control Engineering (01.04.2011)
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Conference Proceeding
Hardware trojans in 3-D ICs due to NBTI effects and countermeasure
Mossa, Siraj Fulum, Hasan, Syed Rafay, Elkeelany, Omar
Published in Integration (Amsterdam) (01.09.2017)
Published in Integration (Amsterdam) (01.09.2017)
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Journal Article