A BIST TPG for Low Power Dissipation and High Fault Coverage
WANG, Seongmoon
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2007)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.07.2007)
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Journal Article
LT-RTPG: a new test-per-scan BIST TPG for low switching activity
Seongmoon Wang, Gupta, S.K.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2006)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2006)
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Journal Article
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors
Seongmoon Wang, Balakrishnan, K.J., Wenlong Wei
Published in IEEE transactions on computers (01.07.2008)
Published in IEEE transactions on computers (01.07.2008)
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Journal Article
DS-LFSR: a new BIST TPG for low heat dissipation
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Conference Proceeding
Journal Article
A self-diagnosis technique using Reed-Solomon codes for self-repairing chips
Xiangyu Tang, Seongmoon Wang
Published in 2009 IEEE/IFIP International Conference on Dependable Systems & Networks (01.06.2009)
Published in 2009 IEEE/IFIP International Conference on Dependable Systems & Networks (01.06.2009)
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Conference Proceeding
Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs
Sethuram, R., Seongmoon Wang, Chakradhar, S.T., Bushnell, M.L.
Published in 2006 15th Asian Test Symposium (01.11.2006)
Published in 2006 15th Asian Test Symposium (01.11.2006)
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Conference Proceeding
Unknown Blocking Scheme for Low Control Data Volume and High Observability
Seongmoon Wang, Wenlong Wei, Chakradhar, S.T.
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
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Conference Proceeding
Atpg For Heat Dissipation Minimization During Scan Testing
Seongmoon Wang, Gupta, S.K.
Published in Proceedings of the 34th Design Automation Conference (1997)
Published in Proceedings of the 34th Design Automation Conference (1997)
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Conference Proceeding
SoC Testing Using LFSR Reseeding, and Scan-Slice- Based TAM Optimization and Test Scheduling
Zhanglei Wang, Chakrabarty, K., Seongmoon Wang
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)
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Conference Proceeding