Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions
Kwon, Sung-Kyu, Kwon, Hyuk-Min, Kwak, Ho-Young, Jang, Jae-Hyung, Shin, Jong-Kwan, Hwang, Seon-Man, Sung, Seung-Yong, Lee, Ga-Won, Lee, Song-Jae, Han, In-Shik, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Hi-Deok
Published in Journal of semiconductor technology and science (01.12.2013)
Published in Journal of semiconductor technology and science (01.12.2013)
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Journal Article
A novel BJT structure for high- performance analog circuit applications
Seon-Man Hwang, Hyuk-Min Kwon, Jae-Hyung Jang, Ho-Young Kwak, Sung-Kyu Kwon, Seung-Yong Sung, Jong-Kwan Shin, Jae-Nam Yu, In-Shik Han, Yi-Sun Chung, Jung-Hwan Lee, Ga-Won Lee, Hi-Deok Lee
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Sampler of composite probe for sampling test sample with high purity
LEE MAN EOP,HWANG SEON CHUN,KIM HYO SANG,KWON YONG CHEOL,LEE CHONG MIN
Year of Publication 15.03.2006
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Year of Publication 15.03.2006
Patent