Search Results - "Seo, Gyeongseob" :: K.UTB vyhledávací portál

Smart Electrical Screening Methodology for Channel Hole Defects of 3D Vertical NAND (VNAND) Flash Memory

by Kim, Beomjun, Seo, Gyeongseob, Kim, Myungsuk
Published in Eng (Basel, Switzerland) (01.03.2024)

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Journal Article

by Cho, Sungjun, Kim, Beomjun, Cho, Hyunuk, Seo, Gyeongseob, Mutlu, Onur, Kim, Myungsuk, Park, Jisung
Year of Publication 16.04.2024

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Journal Article

by Cho, Sungjun, Kim, Beomjun, Cho, Hyunuk, Seo, Gyeongseob, Mutlu, Onur, Kim, Myungsuk, Park, Jisung
Published in arXiv.org (16.04.2024)

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