FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST
Al-AWADHI, Hanan T., AONO, Tomoki, WANG, Senling, HIGAMI, Yoshinobu, TAKAHASHI, Hiroshi, IWATA, Hiroyuki, MAEDA, Yoichi, MATSUSHIMA, Jun
Published in IEICE Transactions on Information and Systems (01.11.2020)
Published in IEICE Transactions on Information and Systems (01.11.2020)
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Journal Article
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST
Wang, Senling, Aono, Tomoki, Higami, Yoshinobu, Takahashi, Hiroshi, Iwata, Hiroyuki, Maeda, Yoichi, Matsushima, Jun
Published in 2018 IEEE 27th Asian Test Symposium (ATS) (01.10.2018)
Published in 2018 IEEE 27th Asian Test Symposium (ATS) (01.10.2018)
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Conference Proceeding
Testing of Interconnect Defects in Memory Based Reconfigurable Logic Device (MRLD)
Senling Wang, Higami, Yoshinobu, Takahashi, Hiroshi, Sato, Masayuki, Katsu, Mitsunori, Sekiguchi, Shoichi
Published in 2017 IEEE 26th Asian Test Symposium (ATS) (01.11.2017)
Published in 2017 IEEE 26th Asian Test Symposium (ATS) (01.11.2017)
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Conference Proceeding
Scan-Out Power Reduction for Logic BIST
WANG, Senling, SATO, Yasuo, KAJIHARA, Seiji, MIYASE, Kohei
Published in IEICE Transactions on Information and Systems (2013)
Published in IEICE Transactions on Information and Systems (2013)
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Journal Article
A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST
Kato, Takaaki, Wang, Senling, Sato, Yasuo, Kajihara, Seiji, Wen, Xiaoqing
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
Published in 2016 IEEE 25th Asian Test Symposium (ATS) (01.11.2016)
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Conference Proceeding
Low Power BIST for Scan-Shift and Capture Power
Sato, Y., Senling Wang, Kato, T., Miyase, K., Kajihara, S.
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
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Conference Proceeding
A Scan-Out Power Reduction Method for Multi-cycle BIST
Senling Wang, Sato, Y., Miyase, K., Kajihara, S.
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
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Conference Proceeding
Excellent antitumor and antimetastatic activities based on novel coumarin/pyrazole oxime hybrids
Dai, Hong, Huang, Meiling, Qian, Jianqiang, Liu, Ji, Meng, Chi, Li, Yangyang, Ming, Guxu, Zhang, Ting, Wang, Senling, Shi, Yujun, Yao, Yong, Ge, Shushan, Zhang, Yanan, Ling, Yong
Published in European journal of medicinal chemistry (15.03.2019)
Published in European journal of medicinal chemistry (15.03.2019)
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Journal Article
Design of True Random Number Generator Based on Multi-Ring Convergence Oscillator Using Short Pulse Enhanced Randomness
Ni, Tianming, Peng, Qingsong, Bian, Jingchang, Yao, Liang, Huang, Zhengfeng, Yan, Aibin, Wang, Senling, Wen, Xiaoqing
Published in IEEE transactions on circuits and systems. I, Regular papers (01.12.2023)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.12.2023)
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Journal Article
Machine Learning Based Fault Diagnosis for Stuck-at Faults and Bridging Faults
Higami, Yoshinobu, Yamauchi, Takaya, Inamoto, Tsutomu, Wang, Senling, Takahashi, Hiroshi, Saluja, Kewal K.
Published in 2022 37th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.01.2022)
Published in 2022 37th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.01.2022)
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Conference Proceeding
Compaction of Fault Dictionary without Degrading Diagnosis Ability
Higami, Yoshinobu, Nakamura, Tomokazu, Inamoto, Tsutomu, Wang, Senling, Takahashi, Hiroshi, Saluja, Kewal K.
Published in 2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (27.06.2021)
Published in 2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (27.06.2021)
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Conference Proceeding
Feasibility of Machine Learning Algorithm for Test Partitioning
Wang, Senling, Al-Awadhi, Hanan T., Aohagi, Masatoshi, Higami, Yoshinobu, Takahashi, Hiroshi
Published in 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.06.2019)
Published in 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.06.2019)
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Conference Proceeding
Compact Dictionaries for Reducing Compute Time in Adaptive Diagnosis
Higami, Yoshinobu, Nakamura, Tomokazu, Inamoto, Tsutomu, Wang, Senling, Takahashi, Hiroshi, Saluja, Kewal K.
Published in 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.06.2019)
Published in 2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (01.06.2019)
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Conference Proceeding
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning
Nie, Mu, Jiang, Wen, Yang, Wankou, Wang, Senling, Wen, Xiaoqing, Ni, Tianming
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)
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Conference Proceeding
Diagnosis of Delay Faults Considering Hazards
Higami, Yoshinobu, Senling Wang, Takahashi, Hiroshi, Kobayashi, Shin-Ya, Saluja, Kewal K.
Published in 2015 IEEE Computer Society Annual Symposium on VLSI (01.07.2015)
Published in 2015 IEEE Computer Society Annual Symposium on VLSI (01.07.2015)
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Conference Proceeding