A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors
Xu, Hui, Li, Jiuqi, Ma, Ruijun, Liang, Huaguo, Liu, Chaoming, Wang, Senling, Wen, Xiaoqing
Published in IEEE transactions on device and materials reliability (01.06.2024)
Published in IEEE transactions on device and materials reliability (01.06.2024)
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Automotive Functional Safety Assurance by POST with Sequential Observation
Wang, Senling, Higami, Yoshinobu, Takahashi, Hiroshi, Iwata, Hiroyuki, Matsushima, Jun
Published in IEEE design and test (01.06.2018)
Published in IEEE design and test (01.06.2018)
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