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Surface defects in 4H-SiC: properties, characterizations and passivation schemes
Mao, Weiwei, Cui, Can, Xiong, Huifan, Zhang, Naifu, Liu, Shuai, Dou, Maofeng, Song, Lihui, Yang, Deren, Pi, Xiaodong
Published in Semiconductor science and technology (01.07.2023)
Published in Semiconductor science and technology (01.07.2023)
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Impact of NaOH solution surface treatment on Al2O3/β-Ga2O3 MOS capacitors
Fang, Paiwen, Liao, Zhengyi, Su, Danni, Liang, Jun, Wang, Xinzhong, Pei, Yanli
Published in Semiconductor science and technology (01.08.2024)
Published in Semiconductor science and technology (01.08.2024)
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Investigating the effect of O2 plasma treatment on the operational characteristics of Schottky-gate AlGaN/GaN HEMT
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Published in Semiconductor science and technology (01.08.2024)
Published in Semiconductor science and technology (01.08.2024)
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High infrared responsivity of silicon photodetector with titanium-hyperdoping
Cheng, Li, Yang, Lei, Fu, Jiawei, Cong, Jingkun, Yang, Deren, Yu, Xuegong
Published in Semiconductor science and technology (01.09.2023)
Published in Semiconductor science and technology (01.09.2023)
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Kinetic Monte Carlo analysis of data retention in Al:HfO2-based resistive random access memories
Aldana, S, Pérez, E, Jiménez-Molinos, F, Wenger, C, Roldán, J B
Published in Semiconductor science and technology (01.11.2020)
Published in Semiconductor science and technology (01.11.2020)
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Germanium surface passivation and atomic layer deposition of high-k dielectrics-a tutorial review on Ge-based MOS capacitors
Xie, Qi, Deng, Shaoren, Schaekers, Marc, Lin, Dennis, Caymax, Matty, Delabie, Annelies, Qu, Xin-Ping, Jiang, Yu-Long, Deduytsche, Davy, Detavernier, Christophe
Published in Semiconductor science and technology (01.07.2012)
Published in Semiconductor science and technology (01.07.2012)
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The effect of temperature on the electrical characteristics of zigzag and armchair black phosphorus based 2D MOSFET
Majumder, Tanmoy, Mukherjee, Chandrima, Dasgupta, Sudeb, Chakraborty, Udayan, Das, Narottam, Bhattacharjee, Abhishek
Published in Semiconductor science and technology (01.10.2024)
Published in Semiconductor science and technology (01.10.2024)
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GaAs-AlGaAs core-shell nanowire lasers on silicon: invited review
Koblmüller, Gregor, Mayer, Benedikt, Stettner, Thomas, Abstreiter, Gerhard, Finley, Jonathan J
Published in Semiconductor science and technology (01.05.2017)
Published in Semiconductor science and technology (01.05.2017)
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Analysis of the scattering mechanisms controlling electron mobility in β-Ga2O3 crystals
Parisini, Antonella, Fornari, Roberto
Published in Semiconductor science and technology (18.02.2016)
Published in Semiconductor science and technology (18.02.2016)
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Preparation and properties of Cu 2 MgSnS 4 thin films and fabrication of heterojunction devices
Aravind, N, Roy, Ronaldo, Kathir, K, Jose, Edwin, Santhosh Kumar, M C
Published in Semiconductor science and technology (01.12.2024)
Published in Semiconductor science and technology (01.12.2024)
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Row hammer-induced D0 failure improvement in sub-20 nm DRAM using an air gap
Yoon, Jiyeong, Yoon, Seokchan, Ahn, Jinho, Shin, Changhwan
Published in Semiconductor science and technology (01.12.2024)
Published in Semiconductor science and technology (01.12.2024)
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