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On-wafer Testing Issues for the 90's and Beyond
Strid, Eric, Dunn, Doug, Shakouri, Mohammad, Williams, Dylan, Golio, Mike
Published in 52nd ARFTG Conference digest : Conference theme "Computer-aided design and test for high-speed electronics", December 3-4, 1998, Double Tree Hotel, Rohnert Park, California (01.12.1991)
Published in 52nd ARFTG Conference digest : Conference theme "Computer-aided design and test for high-speed electronics", December 3-4, 1998, Double Tree Hotel, Rohnert Park, California (01.12.1991)
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Yield Model for Planning and Controlling the Manufacture of VLSI Memory Chips
Stapper, Charles H.
Published in 1985 Symposium on VLSI Technology : Kobe, Japan, May 14-16, 1985 (01.05.1985)
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Published in 1985 Symposium on VLSI Technology : Kobe, Japan, May 14-16, 1985 (01.05.1985)
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An experimental methodology for the estimation of spatially correlated parametric yield in thin film devices
Carlen, E.T., Mastrangelo, C.H.
Published in 1997 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD '97, September 8-10, 1997, Cambridge, MA USA (1997)
Published in 1997 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD '97, September 8-10, 1997, Cambridge, MA USA (1997)
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Temperature effects modelling and compensation analysis in analogue implementation of stochastic artificial neural networks
Madani, K., De Tremiolles, G., Berechet, I.
Published in Microelectronics for Neural Networks and Fuzzy Systems, 4th International Conference On (1994)
Published in Microelectronics for Neural Networks and Fuzzy Systems, 4th International Conference On (1994)
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Macro Testing: Unifying IC And Board Test
Beenker, F.P.M., Eerdewijk, K.j.e. Van, Gerritsen, R.B.W., Peacock, F.N., Der Star, M. Van
Published in IEEE design & test of computers (01.12.1986)
Published in IEEE design & test of computers (01.12.1986)
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Control of batch processing systems
Gurnani, H., Anupindi, R., Akella, R.
Published in Robotics and Automation, '91 International Conference On (1991)
Published in Robotics and Automation, '91 International Conference On (1991)
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Deep Learning-Based Domain Adaptation Method for Fault Diagnosis in Semiconductor Manufacturing
Azamfar, Moslem, Li, Xiang, Lee, Jay
Published in IEEE transactions on semiconductor manufacturing (01.08.2020)
Published in IEEE transactions on semiconductor manufacturing (01.08.2020)
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