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An Integrated Validation Environment for Differential Power Analysis
Di Natale, G., Flottes, M.-L., Rouzeyre, B.
Published in Fourth IEEE International Symposium on Electronic Design, Test and Applications : proceedings : [Delta]'08 : 23-25 January 2008, SAR, China (01.01.2008)
Published in Fourth IEEE International Symposium on Electronic Design, Test and Applications : proceedings : [Delta]'08 : 23-25 January 2008, SAR, China (01.01.2008)
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Investigation of Substrate Noise Coupling and Isolation Characteristics for a 0.35μM HV CMOS Technology
Pflanzl, W.C., Seebacher, E.
Published in Proceedings of the 14th International Conference, Mixed Design of Integrated Circuits and Systems : MIXDES 2007 : Ciechocinek, Poland, 21-23 June, 2007 (01.06.2007)
Published in Proceedings of the 14th International Conference, Mixed Design of Integrated Circuits and Systems : MIXDES 2007 : Ciechocinek, Poland, 21-23 June, 2007 (01.06.2007)
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Evaluating workcell layouts
Nehme, D., McKiddie, R.
Published in Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop (1995)
Published in Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop (1995)
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The care and feeding of your statistical static timer
Nassif, S. R., Boning, D., Hakim, N.
Published in 2004 IEEE/ACM International Conference on Computer-Aided Design (07.11.2004)
Published in 2004 IEEE/ACM International Conference on Computer-Aided Design (07.11.2004)
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A manufacturable 25 nm planar MOSFET technology
Ponomarev, Y.V., Loo, J.J.G.P., Dachs, C.J.J., Cubaynes, F.N., Verheijen, M.A., Kaiser, M., Van Berkum, J.G.M., Kubicek, S., Bolk, J., Rovers, M.
Published in VLSI Circuits, 2001 Symposium on IEEE Electron Devices and IEEE Solid-State Circuits (2001)
Published in VLSI Circuits, 2001 Symposium on IEEE Electron Devices and IEEE Solid-State Circuits (2001)
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High resolution EL2 and resistivity topography of SI GaAs wafers
Wickert, M., Stibal, R., Hiesinger, P., Jantz, W., Wagner, J., Jurisch, M., Kretzer, U., Weinert, B.
Published in 1998 Semiconductor and Insulating Materials Conference (1998)
Published in 1998 Semiconductor and Insulating Materials Conference (1998)
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Very-low-power analog cells in CMOS
Pimentel, J., Salazar, F., Pacheco, M., Gavriel, Y.
Published in 2000 IEEE 43rd Midwest Symposium on Circuits and Systems Proceedings (2000)
Published in 2000 IEEE 43rd Midwest Symposium on Circuits and Systems Proceedings (2000)
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Mobility modeling in presence of quantum effects
Dragosits, K., Palankovski, V., Selberherr, S.
Published in 2003 IEEE International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2003 : Boston, Massachusetts, USA, 3-5 September, 2003 (2003)
Published in 2003 IEEE International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2003 : Boston, Massachusetts, USA, 3-5 September, 2003 (2003)
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Systems analysis applied to modeling dopant activation and TED in rapid thermal annealing
Gunawan, R., Jung, M.Y.L., Braatz, R.D., Seebauer, E.G.
Published in 10th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2002 : September 25-27, 2002, the Coast Plaza Hotel, Vancouver, Canada (2002)
Published in 10th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2002 : September 25-27, 2002, the Coast Plaza Hotel, Vancouver, Canada (2002)
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Mismatch modelling for large area MOS devices
Grunebaum, U., Oehm, J., Schumacher, K.
Published in Proceedings of the 23rd European Solid-State Circuits Conference (1997)
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Published in Proceedings of the 23rd European Solid-State Circuits Conference (1997)
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