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Optimization for Cell Arrangement Design of Gate-Commutated Thyristors Based on Whole Wafer Model and Tabu Search
Lyu, Gang, Zhuang, Chijie, Liu, Jiapeng, Zhao, Biao, Yu, Zhanqing, Zeng, Rong, Zhang, Xueqiang
Published in IEEE transactions on electron devices (01.11.2018)
Published in IEEE transactions on electron devices (01.11.2018)
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A Step-by-Step Layout Transformation Approach to Differentiate How Multiple Layout Dependent Effects Modify Device and Circuit Performance
Lu, Luke, Xia, Kejun, van Langevelde, Ronald, McAndrew, Colin C., Li, Wuxia
Published in Proceedings of the International Conference on Microelectronic Test Structures (15.04.2024)
Published in Proceedings of the International Conference on Microelectronic Test Structures (15.04.2024)
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Robust Control of Overlay Errors in Photolithography Processes
Haq, Asad Ul, Djurdjanovic, Dragan
Published in IEEE transactions on semiconductor manufacturing (01.08.2019)
Published in IEEE transactions on semiconductor manufacturing (01.08.2019)
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Ramp Noise Projection in CMOS Image Sensor Single-Slope ADCs
Levski, Deyan, Wany, Martin, Choubey, Bhaskar
Published in IEEE transactions on circuits and systems. I, Regular papers (01.06.2017)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.06.2017)
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Push Sell Through Surplus Inventory
Jain, Sandeep, Bhaskar, Shyam, Kumari, Nisha, Drolia, Suraj
Published in 2021 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) (13.12.2021)
Published in 2021 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) (13.12.2021)
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Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing
Le Quere, Etienne, Dauzere-Peres, Stephane, Tamssaouet, Karim, Maufront, Cedric, Astie, Stephane
Published in Proceedings - Winter Simulation Conference (14.12.2020)
Published in Proceedings - Winter Simulation Conference (14.12.2020)
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Source/Drain Epitaxy and Contacts for CFET Applications
Porret, Clement, Dursap, Thomas, Akula, Anjani, Rosseel, Erik, Pollefliet, Bert, Everaert, Jean-Luc, Sankaran, Kiroubanand, Merkulov, Alex, Yamamoto, Keisuke, Favia, Paola, Langer, Robert, Kim, Min-Soo, Horiguchi, Naoto, Loo, Roger
Published in Proceedings of the ... IEEE International Conference on Management of Innovation and Technology (Online) (04.06.2025)
Published in Proceedings of the ... IEEE International Conference on Management of Innovation and Technology (Online) (04.06.2025)
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Including Radiation Effects and Dependencies on Process-Related Variability in Advanced Foundry SPICE Models Using a New Physical Model and Parameter Extraction Approach
Li, M., Li, Y. F., Wu, Y. J., Cai, S., Zhu, N. Y., Rezzak, N., Schrimpf, R. D., Fleetwood, D. M., Wang, J. Q., Cheng, X. X., Wang, Y., Wang, D. L., Hao, Y.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs
Ahmadi, Ali, Nahar, Amit, Orr, Bob, Past, Michael, Makris, Yiorgos
Published in Proceedings - IEEE VLSI Test Symposium (01.04.2016)
Published in Proceedings - IEEE VLSI Test Symposium (01.04.2016)
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Total-Body PET/CT Images Used for Generating Digital Phantoms as Training Data for Deep Learning Based Data Corrections
Omidvari, N., Li, T., Spencer, B. A., Leung, E. K., Sun, X., Badawi, R. D., Li, H., Qi, J., Cherry, S. R.
Published in IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference. (26.10.2024)
Published in IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference. (26.10.2024)
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Probabilistic Error Models for machine learning kernels implemented on stochastic nanoscale fabrics
Sai Zhang, Shanbhag, Naresh R.
Published in Proceedings - Design, Automation, and Test in Europe Conference and Exhibition (01.03.2016)
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Published in Proceedings - Design, Automation, and Test in Europe Conference and Exhibition (01.03.2016)
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Petri net-based scheduling analysis of dual-arm cluster tools subject to wafer revisiting and residency time constraints
Yan Qiao, NaiQi Wu, MengChu Zhou, QingYun Dai
Published in 2013 IEEE 10th International Conference on Networking, Sensing and Control (ICNSC) (01.04.2013)
Published in 2013 IEEE 10th International Conference on Networking, Sensing and Control (ICNSC) (01.04.2013)
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ICCAD-2013 CAD contest in mask optimization and benchmark suite
Banerjee, Shayak, Li, Zhuo, Nassif, Sani R.
Published in Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design (01.11.2013)
Published in Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design (01.11.2013)
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A modeling of soldering adhesion forecast for the crystalline silicon solar cell
Wen-Tai Chung, Wei-Cyun Lee, Chi-Kun Wu, Yu-Ting Hung, Chien-Wen Chen
Published in Conference record of the IEEE Photovoltaic Specialists Conference (01.06.2014)
Published in Conference record of the IEEE Photovoltaic Specialists Conference (01.06.2014)
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Small signal impedance analysis of high efficient power devices
Tulbure, Adrian, Hutanu, Constantin, Brezeanu, Gheorghe
Published in 2015 International Semiconductor Conference (CAS) (01.10.2015)
Published in 2015 International Semiconductor Conference (CAS) (01.10.2015)
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