Epitaxial undoped indium oxide thin films: Structural and physical properties
Seiler, W., Nistor, M., Hebert, C., Perrière, J.
Published in Solar energy materials and solar cells (01.09.2013)
Published in Solar energy materials and solar cells (01.09.2013)
Get full text
Journal Article
Transparent conductive Nd-doped ZnO thin films
Nistor, M, Millon, E, Cachoncinlle, C, Seiler, W, Jedrecy, N, Hebert, C, Perrière, J
Published in Journal of physics. D, Applied physics (20.05.2015)
Published in Journal of physics. D, Applied physics (20.05.2015)
Get full text
Journal Article
Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction
Marciszko, Marianna, Baczmański, Andrzej, Wróbel, Mirosław, Seiler, Wilfrid, Braham, Chedly, Wroński, Sebastian, Wawszczak, Roman
Published in Journal of applied crystallography (01.04.2015)
Published in Journal of applied crystallography (01.04.2015)
Get full text
Journal Article
Growth, structural and electrical properties of polar ZnO thin films on MgO (100) substrates
Nistor, M., Mandache, N.B., Perrière, J., Hebert, C., Gherendi, F., Seiler, W.
Published in Thin solid films (31.03.2011)
Published in Thin solid films (31.03.2011)
Get full text
Journal Article
Epitaxial ZnO thin films grown by pulsed electron beam deposition
Tricot, S., Nistor, M., Millon, E., Boulmer-Leborgne, C., Mandache, N.B., Perrière, J., Seiler, W.
Published in Surface science (01.10.2010)
Published in Surface science (01.10.2010)
Get full text
Journal Article
Multireflection grazing incidence diffraction used for stress measurementsin surface layers
Marciszko, Marianna, Baczmanski, Andrzej, Wrobel, Miroslaw, Seiler, Wilfried, Braham, Chedly, Donges, Jörn, Sniechowski, Maciej Iek, Wierzbanowskia, Krzysztof
Published in Thin solid films (2013)
Published in Thin solid films (2013)
Get full text
Journal Article