Rapid thermal processing of self-assembling block copolymer thin films
Ferrarese Lupi, F, Giammaria, T J, Ceresoli, M, Seguini, G, Sparnacci, K, Antonioli, D, Gianotti, V, Laus, M, Perego, M
Published in Nanotechnology (09.08.2013)
Published in Nanotechnology (09.08.2013)
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Journal Article
Solid-state dewetting of ultra-thin Au films on SiO2 and HfO2
Seguini, G, Llamoja Curi, J, Spiga, S, Tallarida, G, Wiemer, C, Perego, M
Published in Nanotechnology (12.12.2014)
Published in Nanotechnology (12.12.2014)
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Journal Article
High Aspect Ratio PS‑b‑PMMA Block Copolymer Masks for Lithographic Applications
Ferrarese Lupi, F, Giammaria, T. J, Volpe, F. G, Lotto, F, Seguini, G, Pivac, B, Laus, M, Perego, M
Published in ACS applied materials & interfaces (10.12.2014)
Published in ACS applied materials & interfaces (10.12.2014)
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Journal Article
Scaling of correlation length in lamellae forming PS-b-PMMA thin films upon high temperature rapid thermal treatments
Ceresoli, M., Volpe, F. G., Seguini, G., Antonioli, D., Gianotti, V., Sparnacci, K., Laus, M., Perego, M.
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2015)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2015)
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Magnetization switching in high-density magnetic nanodots by a fine-tune sputtering process on a large-area diblock copolymer mask
Barrera, G, Celegato, F, Coïsson, M, Manzin, A, Ferrarese Lupi, F, Seguini, G, Boarino, L, Aprile, G, Perego, M, Tiberto, P
Published in Nanoscale (21.11.2017)
Published in Nanoscale (21.11.2017)
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Journal Article
Influence of block copolymer feature size on reactive ion etching pattern transfer into silicon
Dialameh, M, Lupi, F Ferrarese, Imbraguglio, D, Zanenga, F, Lamperti, A, Martella, D, Seguini, G, Perego, M, Rossi, A M, De Leo, N, Boarino, L
Published in Nanotechnology (06.10.2017)
Published in Nanotechnology (06.10.2017)
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Journal Article
Quantification of phosphorus diffusion and incorporation in silicon nanocrystals embedded in silicon oxide
Mastromatteo, M., Arduca, E., Napolitani, E., Nicotra, G., De Salvador, D., Bacci, L., Frascaroli, J., Seguini, G., Scuderi, M., Impellizzeri, G., Spinella, C., Perego, M., Carnera, A.
Published in Surface and interface analysis (01.11.2014)
Published in Surface and interface analysis (01.11.2014)
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Collective behavior of block copolymer thin films within periodic topographical structures
Perego, M, Andreozzi, A, Vellei, A, Ferrarese Lupi, F, Seguini, G
Published in Nanotechnology (21.06.2013)
Published in Nanotechnology (21.06.2013)
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Neutral wetting brush layers for block copolymer thin films using homopolymer blends processed at high temperatures
Ceresoli, M, Palermo, M, Ferrarese Lupi, F, Seguini, G, Perego, M, Zuccheri, G, Phadatare, S D, Antonioli, D, Gianotti, V, Sparnacci, K, Laus, M
Published in Nanotechnology (16.10.2015)
Published in Nanotechnology (16.10.2015)
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Journal Article
Flash grafting of functional random copolymers for surface neutralization
Lupi, F. Ferrarese, Giammaria, T. J., Seguini, G., Ceresoli, M., Perego, M., Antonioli, D., Gianotti, V., Sparnacci, K., Laus, M.
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2014)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2014)
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Journal Article
The fabrication of tunable nanoporous oxide surfaces by block copolymer lithography and atomic layer deposition
Andreozzi, A, Lamagna, L, Seguini, G, Fanciulli, M, Schamm-Chardon, S, Castro, C, Perego, M
Published in Nanotechnology (19.08.2011)
Published in Nanotechnology (19.08.2011)
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Journal Article
Electronic band structures of undoped and P-doped Si nanocrystals embedded in SiO2
Arduca, E, Seguini, G, Martella, C, Lamperti, A, Napolitani, E, De Salvador, D, Nicotra, G, Scuderi, M, Spinella, C, Perego, M
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2018)
Published in Journal of materials chemistry. C, Materials for optical and electronic devices (01.01.2018)
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Journal Article
Atomic layer deposited TiO2 for implantable brain-chip interfacing devices
Cianci, E., Lattanzio, S., Seguini, G., S.Vassanelli, Fanciulli, M.
Published in Thin solid films (01.05.2012)
Published in Thin solid films (01.05.2012)
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Conference Proceeding
Surface passivation for ultrathin Al2O3 layers grown at low temperature by thermal atomic layer deposition
Frascaroli, J., Seguini, G., Cianci, E., Saynova, D., van Roosmalen, J., Perego, M.
Published in Physica status solidi. A, Applications and materials science (01.04.2013)
Published in Physica status solidi. A, Applications and materials science (01.04.2013)
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Journal Article
In-plane organization of silicon nanocrystals embedded in SiO2 thin films
Castro, C, Schamm-Chardon, S, Pecassou, B, Andreozzi, A, Seguini, G, Perego, M, BenAssayag, G
Published in Nanotechnology (22.02.2013)
Published in Nanotechnology (22.02.2013)
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Journal Article
Si nanocrystal synthesis in HfO2/SiO/HfO2 multilayer structures
Perego, M, Seguini, G, Wiemer, C, Fanciulli, M, Coulon, P-E, Bonafos, C
Published in Nanotechnology (05.02.2010)
Published in Nanotechnology (05.02.2010)
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X-ray photoelectron spectroscopy study of energy-band alignments of Lu2O3 on Ge
Perego, M., Seguini, G., Scarel, G., Fanciulli, M.
Published in Surface and interface analysis (01.04.2006)
Published in Surface and interface analysis (01.04.2006)
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Conference Proceeding
XPS and IPE analysis of HfO2 band alignment with high-mobility semiconductors
PEREGO, M, SEGUINI, G, FANCIULLI, M
Published in Materials science in semiconductor processing (01.10.2008)
Published in Materials science in semiconductor processing (01.10.2008)
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Conference Proceeding
Journal Article
Magnetization switching in high-density magnetic nanodots by a fine-tune sputtering process on a large-area diblock copolymer maskElectronic supplementary information (ESI) available: Experimentally evaluation of deposition rate of Ni80Fe20 and Co materials. Zero-field and field cooling (H = 10 kOe) hysteresis loops of Ni80Fe20 nanodot array measured at T = 5 K. XRD pattern and analysis of Co thin film. See DOI: 10.1039/c7nr04295g
Barrera, G, Celegato, F, Coïsson, M, Manzin, A, Ferrarese Lupi, F, Seguini, G, Boarino, L, Aprile, G, Perego, M, Tiberto, P
Year of Publication 09.11.2017
Year of Publication 09.11.2017
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