by Tyaginov, S.E., Starkov, I.A., Triebl, O., Cervenka, J., Jungemann, C., Carniello, S., Park, J.M., Enichlmair, H., Karner, M., Kernstock, Ch, Seebacher, E., Minixhofer, R., Ceric, H., Grasser, T.
Published in Microelectronics and reliability (01.09.2010)

by Boeckle, D., Tabares, P., Zhou, X., Schimanski, S., Steinhardt, M. J., Bittrich, M., Seebacher, E., Ulbrich, M., Wilnit, A., Metz, C., Heidemeier, A., Bley, T., Werner, R., Buck, A., Einsele, H., Kortüm, M., Beilhack, A., Rasche, L.
Published in HemaSphere (23.06.2022)

by Bazigos, A, Krummenacher, F, Sallese, J.-M, Bucher, M, Seebacher, E, Posch, W, Molnár, K, Mingchun Tang
Published in IEEE transactions on electron devices (01.06.2011)

by Miura-Mattausch, M., Miyamoto, H., Kikuchihara, H., Navarro, D., Maiti, T. K., Rohbani, N., Ma, C., Mattausch, H. J., Schiffmann, A., Steinmair, A., Seebacher, E.
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)

by Tyaginov, S., Starkov, I., Enichlmair, H., Jungemann, Ch, Park, J.M., Seebacher, E., Orio, R., Ceric, H., Grasser, T.
Published in Microelectronics and reliability (01.09.2011)

by Ioan, D., Ciuprina, G., Radulescu, M., Seebacher, E.
Published in IEEE transactions on magnetics (01.04.2006)

by Tomasevic, V., Boyer, A., Bendhia, S., Steinmair, A., Weiss, B., Seebacher, E., Rust, P.
Published in 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) (01.08.2015)

by Knaipp, M., Rohrer, G., Minixhofer, R., Seebacher, E.
Published in IEEE transactions on electron devices (01.10.2004)

by Molnar, K., Rappitsch, G., Huszka, Z., Seebacher, E.
Published in IEEE transactions on electron devices (01.07.2002)

by Minixhofer, R, Feilchenfeld, N, Knaipp, M, Röhrer, G, Park, J M, Zierak, M, Enichlmair, H, Levy, M, Loeffler, B, Hershberger, D, Unterleitner, F, Gautsch, M, Chatty, K, Shi, Y, Posch, W, Seebacher, E, Schrems, M, Dunn, J, Harame, D
Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)

by Rappitsch, G., Seebacher, E., Kocher, M., Stadlober, E.
Published in IEEE transactions on semiconductor manufacturing (01.05.2004)

by Huszka, Z., Seebacher, E., Pflanzl, W.
Published in Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005 (2005)

by Ioannidis, E.G., Pflanzl, W.C., Stueckler, E., Vescoli, V., Carniello, S., Seebacher, E.
Published in Solid-state electronics (01.12.2016)

by Ioannidis, E.G., Rohracher, K., Roger, F., Pflanzl, W.C., Leisenberger, F.P., Wachmann, E., Seebacher, E., Vescoli, V.
Published in Solid-state electronics (01.09.2017)

by Tomasevic, V., Steinmair, A., Boyer, A., Ben Dhia, S., Weiss, B., Rust, P., Seebacher, E.
Published in 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) (01.06.2015)

by Posch, W., Seebacher, E.
Published in IEEE transactions on semiconductor manufacturing (01.08.2012)

by Huszka, Z, Céli, Didier, Seebacher, E
Published in IEEE transactions on electron devices (01.02.2011)

by Huszka, Zoltán, Céli, D, Seebacher, E
Published in IEEE transactions on electron devices (01.02.2011)

by Tyaginov, S E, Starkov, I A, Triebl, O, Cervenka, J, Jungemann, C, Carniello, S, Park, J M, Enichlmair, H, Karner, M, Kernstock, C, Seebacher, E, Minixhofer, R, Ceric, H, Grasser, T
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)

by Starkov, I A, Tyaginov, S E, Triebl, O, Cervenka, J, Jungemann, C, Carniello, S, Park, J M, Enichlmair, H, Karner, M, Kernstock, C, Seebacher, E, Minixhofer, R, Ceric, H, Grasser, T
Published in 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2010)