Extended Strip Model for Reinforced Concrete Slabs under Concentrated Loads
Lantsoght, Eva O. L., van der Veen, Cor, de Boer, Ane, Alexander, Scott D. B.
Published in ACI structural journal (01.03.2017)
Published in ACI structural journal (01.03.2017)
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Journal Article
Behavior of slab-column connections with partially debonded reinforcement under lateral loading
Choi, Jung-Wook, Ali, Malika, Alexander, Scott D.B
Published in Canadian journal of civil engineering (01.03.2009)
Published in Canadian journal of civil engineering (01.03.2009)
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Journal Article
Reliability effects on MOS transistors due to hot-carrier injection
Kueing-Long Chen, Saller, S.A., Groves, I.A., Scott, D.B.
Published in IEEE transactions on electron devices (01.02.1985)
Published in IEEE transactions on electron devices (01.02.1985)
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Journal Article
Monitoring oil spill bioremediation using marsh foraminifera as indicators
Sabean, J.A.R., Scott, D.B., Lee, K., Venosa, A.D.
Published in Marine pollution bulletin (01.01.2009)
Published in Marine pollution bulletin (01.01.2009)
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Journal Article
Postglacial sea-level rise and sedimentary response in the Guadiana Estuary, Portugal/Spain border
Boski, T., Moura, D., Veiga-Pires, C., Camacho, S., Duarte, D., Scott, D.B., Fernandes, S.G.
Published in Sedimentary geology (15.06.2002)
Published in Sedimentary geology (15.06.2002)
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Journal Article
Nodulating strains of Rhizobium loti arise through chromosomal symbiotic gene transfer in the environment
Sullivan, J.T. (University of Otago, Dunedin, New Zealand.), Patrick, H.N, Lowther, W.L, Scott, D.B, Ronson, C.W
Published in Proceedings of the National Academy of Sciences - PNAS (12.09.1995)
Published in Proceedings of the National Academy of Sciences - PNAS (12.09.1995)
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Journal Article
Effects of uniaxial mechanical stress on drive current of 0.13 μm MOSFETs
Wang, Y.G., Scott, D.B., Wu, J., Waller, J.L., Hu, J., Liu, K., Ukraintsev, V.
Published in IEEE transactions on electron devices (01.02.2003)
Published in IEEE transactions on electron devices (01.02.2003)
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Journal Article
Reliability Effects on MOS Transistors Due to Hot-Carrier Injection
Kueing-Long Chen, Saller, S.A., Groves, I.A., Scott, D.B.
Published in IEEE journal of solid-state circuits (01.02.1985)
Published in IEEE journal of solid-state circuits (01.02.1985)
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Journal Article