Trading Off Test Coverage and False Reject Risk of Self-Calibrating Self-Test Systems
von Staudt, H. M., Schwiderski, F.
Published in 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop (01.05.2012)
Published in 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop (01.05.2012)
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