32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches
Rodbell, K. P., Heidel, D. F., Pellish, J. A., Marshall, P. W., Tang, H. H. K., Murray, C. E., LaBel, K. A., Gordon, M. S., Stawiasz, K. G., Schwank, J. R., Berg, M. D., Kim, H. S., Friendlich, M. R., Phan, A. M., Seidleck, C. M.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements
Schwank, J R, Shaneyfelt, M R, McMorrow, D, Ferlet-Cavrois, V, Dodd, P E, Heidel, D F, Marshall, P W, Pellish, J A, LaBel, K A, Rodbell, K P, Hakey, M, Flores, R S, Swanson, S E, Dalton, S M
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
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Journal Article
Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains
Dodd, P. E., Shaneyfelt, M. R., Flores, R. S., Schwank, J. R., Hill, T. A., McMorrow, D., Vizkelethy, G., Swanson, S. E., Dalton, S. M.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies
Pellish, Jonathan A., Marshall, Paul W., Rodbell, Kenneth P., Gordon, Michael S., LaBel, Kenneth A., Schwank, James R., Dodds, Nathaniel A., Castaneda, Carlos M., Berg, Melanie D., Kim, Hak S., Phan, Anthony M., Seidleck, Christina M.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets
Clemens, M. A., Sierawski, B. D., Warren, K. M., Mendenhall, M. H., Dodds, N. A., Weller, R. A., Reed, R. A., Dodd, P. E., Shaneyfelt, M. R., Schwank, J. R., Wender, S. A., Baumann, R. C.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Influence of Beam Conditions and Energy for SEE Testing
Ferlet-Cavrois, Veronique, Schwank, James R., Liu, Sandra, Muschitiello, Michele, Beutier, Thierry, Javanainen, Arto, Hedlund, Alex, Poivey, Christian, Mohammadzadeh, Ali, Harboe-Sorensen, Reno, Santin, Giovanni, Nickson, Bob, Menicucci, Alessandra, Binois, Christian, Peyre, Daniel, Hoeffgen, Stefan Klaus, Metzger, Stefan, Schardt, Dieter, Kettunen, Heikki, Virtanen, Ari, Berger, Guy, Piquet, Bruno, Foy, Jean-Claude, Zafrani, Max, Truscott, Pete, Poizat, Marc, Bezerra, Francoise
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
SEGR in SiO 2 -Si 3 N 4 Stacks
Javanainen, Arto, Ferlet-Cavrois, Véronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., Virtanen, Ari
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
The Effect of High-Z Materials on Proton-Induced Charge Collection
Clemens, M A, Hooten, N C, Ramachandran, V, Dodds, N A, Weller, R A, Mendenhall, M H, Reed, R A, Dodd, P E, Shaneyfelt, M R, Schwank, J R, Blackmore, E W
Published in IEEE transactions on nuclear science (01.12.2010)
Published in IEEE transactions on nuclear science (01.12.2010)
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Journal Article
Hardness Assurance Testing for Proton Direct Ionization Effects
Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Dodd, P. E., Blackmore, E. W., Pellish, J. A., Rodbell, K. P., Heidel, D. F., Marshall, P. W., LaBel, K. A., Gouker, P. M., Tam, N., Wong, R., Shi-Jie Wen, Reed, R. A., Dalton, S. M., Swanson, S. E.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs-Methodology for Radiation Hardness Assurance
Ferlet-Cavrois, V., Binois, C., Carvalho, A., Ikeda, N., Inoue, M., Eisener, B., Gamerith, S., Chaumont, G., Pintacuda, F., Javanainen, A., Schwank, J. R., Shaneyfelt, M. R., Lauenstein, J-M, Ladbury, R. L., Muschitiello, M., Poivey, C., Mohammadzadeh, A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Radiation Effects in 3D Integrated SOI SRAM Circuits
Gouker, P. M., Tyrrell, B., D'Onofrio, R., Wyatt, P., Soares, T., Weilin Hu, Chenson Chen, Schwank, J. R., Shaneyfelt, M. R., Blackmore, E. W., Delikat, K., Nelson, M., McMarr, P., Hughes, H., Ahlbin, J. R., Weeden-Wright, S., Schrimpf, R.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs
Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E., McMorrow, D., Warner, J. H., Ferlet-Cavrois, V., Gouker, P. M., Melinger, J. S., Pellish, J. A., Rodbell, K. P., Heidel, D. F., Marshall, P. W., LaBel, K. A., Swanson, S. E.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques
Schwank, J R, Shaneyfelt, M R, Dodd, P E, McMorrow, D, Vizkelethy, G, Ferlet-Cavrois, V, Gouker, P M, Flores, R S, Stevens, J, Buchner, S B, Dalton, S M, Swanson, S E
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article
Effects of Moisture on Radiation-Induced Degradation in CMOS SOI Transistors
Shaneyfelt, Marty R, Schwank, James R, Dodd, Paul E, Hill, Tom A, Dalton, Scott M, Swanson, Scot E
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
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Journal Article
Heavy Ion Testing With Iron at 1 GeV/amu
Pellish, Jonathan A, Xapsos, Michael A, LaBel, Kenneth A, Marshall, Paul W, Heidel, David F, Rodbell, Kenneth P, Hakey, Mark C, Dodd, Paul E, Shaneyfelt, Marty R, Schwank, James R, Baumann, Robert C, Xiaowei Deng, Marshall, Andrew, Sierawski, Brian D, Black, Jeffrey D, Reed, Robert A, Schrimpf, Ronald D, Kim, Hak S, Berg, Melanie D, Campola, Michael J, Friendlich, Mark R, Perez, Christopher E, Phan, Anthony M, Seidleck, Christina M
Published in IEEE transactions on nuclear science (01.10.2010)
Published in IEEE transactions on nuclear science (01.10.2010)
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Journal Article
Implications of radiation-induced dopant deactivation for npn bipolar junction transistors
Witczak, S.C., Lacoe, R.C., Shaneyfelt, M.R., Mayer, D.C., Schwank, J.R., Winokur, P.S.
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance
Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E.
Published in IEEE transactions on nuclear science (01.06.2013)
Published in IEEE transactions on nuclear science (01.06.2013)
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Journal Article
Conference Proceeding