In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB
Schwalb, Chistian, Hütner, Johanna, Frerichs, Hajo, Wolff, Marion, Winkler, Robert, Andany, Santiago, Hosemann, Peter, Hlawacek, Gregor, Fantner, Georg, Plank, Harald
Published in Microscopy and microanalysis (01.08.2021)
Published in Microscopy and microanalysis (01.08.2021)
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