Specific Adaptations of Mechanical Machining Processes for Laser Target Manufacturing
Andre, J., Botrel, R., Schunck, J., Pinay, A., Chicanne, C., Theobald, M.
Published in Fusion science and technology (01.09.2016)
Published in Fusion science and technology (01.09.2016)
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The TRIXS end-station for femtosecond time-resolved resonant inelastic x-ray scattering experiments at the soft x-ray free-electron laser FLASH
Dziarzhytski, S., Biednov, M., Dicke, B., Wang, A., Miedema, P. S., Engel, R. Y., Schunck, J. O., Redlin, H., Weigelt, H., Siewert, F., Behrens, C., Sinha, M., Schulte, A., Grimm-Lebsanft, B., Chiuzbăian, S. G., Wurth, W., Beye, M., Rübhausen, M., Brenner, G.
Published in Structural dynamics (Melville, N.Y.) (01.09.2020)
Published in Structural dynamics (Melville, N.Y.) (01.09.2020)
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Sinusoidal Ripples Micromachining on CHx Ablator for Hydrodynamics Growth Experiments
Geoffray, I., Andre, J., Bourdenet, R., Schunck, J., Chicanne, C., Theobald, M.
Published in Fusion science and technology (01.09.2016)
Published in Fusion science and technology (01.09.2016)
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Copper behavior in bulk silicon and associated characterization techniques
HEISER, T, BELAYACHI, A, SCHUNCK, J. P
Published in Journal of the Electrochemical Society (01.12.2003)
Published in Journal of the Electrochemical Society (01.12.2003)
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Influence of light on interstitial copper in p-type silicon
BELAYACHI, A, HEISER, T, SCHUNCK, J. P, KEMPF, A
Published in Applied physics. A, Materials science & processing (01.02.2005)
Published in Applied physics. A, Materials science & processing (01.02.2005)
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Optimisation of a combined transient-ion-drift/rapid thermal annealing process for copper detection in silicon
Belayachi, A., Heiser, T., Schunck, J.P., Bourdais, S., Bloechl, P., Huber, A., Kempf, A.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.09.2003)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15.09.2003)
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Excimer laser ablation lithography applied to the fabrication of reflective diffractive optics
Flury, M., Benatmane, A., Gérard, P., Montgomery, P.C., Fontaine, J., Engel, T., Schunck, J.P., Fogarassy, E.
Published in Applied surface science (15.03.2003)
Published in Applied surface science (15.03.2003)
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Silicon self-diffusivity measurement in thermal SiO2 by Si30/Si28 isotopic exchange
Mathiot, D., Schunck, J. P., Perego, M., Fanciulli, M., Normand, P., Tsamis, C., Tsoukalas, D.
Published in Journal of applied physics (01.08.2003)
Published in Journal of applied physics (01.08.2003)
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Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser
Engel, Robin Y., Miedema, Piter S., Turenne, Diego, Vaskivskyi, Igor, Brenner, Günter, Dziarzhytski, Siarhei, Kuhlmann, Marion, Schunck, Jan O., Döring, Florian, Styervoyedov, Andriy, Parkin, Stuart S.P., David, Christian, Schüßler-Langeheine, Christian, Dürr, Hermann A., Beye, Martin
Published in Applied sciences (01.10.2020)
Published in Applied sciences (01.10.2020)
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