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Globales Produktmanagement (Volume 30.0)

Globales Produktmanagement (Volume 30.0)

by Schröder, Hans-Ulrich
Year of Publication 01.01.2018

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eBook

Charge detector semiconductor device, system consisting of a charge detector semiconductor device and a reference semiconductor device, wafer, use of a wafer and method of the qualitative measurement of the charge up of a wafer

Charge detector semiconductor device, system consisting of a charge detector semiconductor device and a reference semiconductor device, wafer, use of a wafer and method of the qualitative measurement of the charge up of a wafer

by SCHROEDER, HANS-ULRICH
Year of Publication 22.03.2006

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Patent

CHARGE DETECTOR SEMICONDUCTOR COMPONENT, SYSTEM COMPRISING A CHARGE DETECTOR SEMICONDUCTOR COMPONENT AND A REFERENCE SEMICONDUCTOR COMPONENT, WAFER, USE OF A WAFER, AND METHOD FOR THE QUALITATIVE AND QUANTITATIVE MEASUREMENT OF CHARGING OF A WAFER

CHARGE DETECTOR SEMICONDUCTOR COMPONENT, SYSTEM COMPRISING A CHARGE DETECTOR SEMICONDUCTOR COMPONENT AND A REFERENCE SEMICONDUCTOR COMPONENT, WAFER, USE OF A WAFER, AND METHOD FOR THE QUALITATIVE AND QUANTITATIVE MEASUREMENT OF CHARGING OF A WAFER

by Schroeder, Hans-Ulrich
Year of Publication 08.06.2004

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Patent

CHARGE DETECTOR SEMICONDUCTOR COMPONENT, SYSTEM COMPRISING A CHARGE DETECTOR SEMICONDUCTOR COMPONENT AND A REFERENCE SEMICONDUCTOR COMPONENT, WAFER, USE OF A WAFER, AND METHOD FOR THE QUALITATIVE AND QUANTITATIVE MEASUREMENT OF CHARGING OF A WAFER

CHARGE DETECTOR SEMICONDUCTOR COMPONENT, SYSTEM COMPRISING A CHARGE DETECTOR SEMICONDUCTOR COMPONENT AND A REFERENCE SEMICONDUCTOR COMPONENT, WAFER, USE OF A WAFER, AND METHOD FOR THE QUALITATIVE AND QUANTITATIVE MEASUREMENT OF CHARGING OF A WAFER

by SCHROEDER HANS-ULRICH
Year of Publication 08.06.2004

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Patent

CHARGE DETECTOR SEMICONDUCTOR ELEMENT, SYSTEM COMPRISING THE SAME AND REFERENCE SEMICONDUCTOR ELEMENT, WAFER, USE THEREOF, AND METHOD FOR QUALITATIVE AND QUANTITATIVE MEASUREMENT OF CHARGING THEREOF

CHARGE DETECTOR SEMICONDUCTOR ELEMENT, SYSTEM COMPRISING THE SAME AND REFERENCE SEMICONDUCTOR ELEMENT, WAFER, USE THEREOF, AND METHOD FOR QUALITATIVE AND QUANTITATIVE MEASUREMENT OF CHARGING THEREOF

by SCHROEDER HANS-ULRICH
Year of Publication 31.07.2003

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Patent

Charge detector semiconductor component, system comprising a charge detector semiconductor component and a reference semiconductor component, wafer, use of a wafer, and method for the qualitative and quantitative measurement of charging of a wafer

Charge detector semiconductor component, system comprising a charge detector semiconductor component and a reference semiconductor component, wafer, use of a wafer, and method for the qualitative and quantitative measurement of charging of a wafer

by Schroeder, Hans-Ulrich
Year of Publication 29.05.2003

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Patent

Charge detector semiconductor component, system comprising a charge detector semiconductor component and a reference semiconductor component, wafer, use of a wafer, and method for the qualitative and quantitative measurement of charging of a wafer

Charge detector semiconductor component, system comprising a charge detector semiconductor component and a reference semiconductor component, wafer, use of a wafer, and method for the qualitative and quantitative measurement of charging of a wafer

by SCHROEDER HANS-ULRICH
Year of Publication 29.05.2003

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Patent

Semiconductor device comprising a non-volatile memory cell

Semiconductor device comprising a non-volatile memory cell

by SCHROEDER, HANS-ULRICH
Year of Publication 21.01.2002

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Patent

Arrangement for improving the ESD protection in a CMOS buffer

Arrangement for improving the ESD protection in a CMOS buffer

by Schroeder, Hans-Ulrich, Reiner, Joachim
Year of Publication 20.06.2002

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Patent

Globales Produktmanagement: Eine empirische Analyse des Instrumenteeinsatzes in ausgewaehlten Branchen der Konsumgueterindustrie

Globales Produktmanagement: Eine empirische Analyse des Instrumenteeinsatzes in ausgewaehlten Branchen der Konsumgueterindustrie

by Schröder, Hans-Ulrich
Year of Publication 2018

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eBook

Arrangement for improving the ESD protection in a CMOS buffer

Arrangement for improving the ESD protection in a CMOS buffer

by SCHROEDER HANS-ULRICH, REINER JOACHIM CHRISTIAN
Year of Publication 04.03.2003

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Patent

Arrangement for improving the ESD protection in a CMOS buffer

Arrangement for improving the ESD protection in a CMOS buffer

by Schroeder, Hans-Ulrich, Reiner, Joachim Christian
Year of Publication 04.03.2003

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Patent

Integrated circuit comprising analog and digital sub-circuits with improved over-voltage protection and reduced substrate-noise coupling

Integrated circuit comprising analog and digital sub-circuits with improved over-voltage protection and reduced substrate-noise coupling

by SCHROEDER HANS-ULRICH, WELBERS ANTONIUS P. G
Year of Publication 01.10.2002

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Patent

Arrangement for improving the ESD protection in a CMOS buffer

Arrangement for improving the ESD protection in a CMOS buffer

by SCHROEDER HANS-ULRICH, REINER JOACHIM CHRISTIAN
Year of Publication 20.06.2002

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Patent

DEVICE FOR IMPROVING PROTECTION OF ESD IN CMOS BUFFER

DEVICE FOR IMPROVING PROTECTION OF ESD IN CMOS BUFFER

by SCHROEDER HANS-ULRICH, REINER JOACHIM CHRISTIAN
Year of Publication 17.05.2002

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Patent

SEMICONDUCTOR DEVICE INCLUDING AN INTEGRATED ESD PROTECTION FIELD EFFECT DEVICE

SEMICONDUCTOR DEVICE INCLUDING AN INTEGRATED ESD PROTECTION FIELD EFFECT DEVICE

by SCHROEDER, HANS-ULRICH, REINER, JOACHIM, C
Year of Publication 03.05.2001

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Patent

OVER-VOLTAGE PROTECTION FOR INTEGRATED ANALOG AND DIGITAL CIRCUITS

OVER-VOLTAGE PROTECTION FOR INTEGRATED ANALOG AND DIGITAL CIRCUITS

by WELBERS, ANTONIUS, P., G, SCHROEDER, HANS-ULRICH
Year of Publication 18.05.2000

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Patent

Ladungsdetektor-Halbleiterbauelement, System aus einem Ladungsdetektor-Halbleiterbauelement und einem Referenz-Halbleiterbauelement, Wafer, Verwendung eines Wafers und Verfahren zur qualitativen und quantitativen Messung einer Aufladung eines Wafers

Ladungsdetektor-Halbleiterbauelement, System aus einem Ladungsdetektor-Halbleiterbauelement und einem Referenz-Halbleiterbauelement, Wafer, Verwendung eines Wafers und Verfahren zur qualitativen und quantitativen Messung einer Aufladung eines Wafers

by SCHROEDER, HANS-ULRICH
Year of Publication 15.05.2003

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Patent

Charge detector semiconductor device, system consisting of a charge detector semiconductor device and a reference semiconductor device, wafer, use of a wafer and method of the qualitative measurement of the charge up of a wafer

Charge detector semiconductor device, system consisting of a charge detector semiconductor device and a reference semiconductor device, wafer, use of a wafer and method of the qualitative measurement of the charge up of a wafer

by SCHROEDER, HANS-ULRICH
Year of Publication 07.05.2003

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Patent

Yield enhancement of a 16.6 cm super(2) monolithic large-area integrated multiprocessor system using laser reconfiguration

Yield enhancement of a 16.6 cm super(2) monolithic large-area integrated multiprocessor system using laser reconfiguration

by Schroeder, Hans-Ulrich, Otterstedt, Jan, Hillmann-Ruge, Thomas
Published in IEEE transactions on components, packaging and manufacturing technology. Part C, Manufacturing (01.01.1996)

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Journal Article