High resolution structure imaging of octahedral void defects in as-grown Czochralski silicon
BENDER, G, VANHELLEMONT, J, SCHMOLKE, R
Published in Japanese Journal of Applied Physics (15.09.1997)
Published in Japanese Journal of Applied Physics (15.09.1997)
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Journal Article
Morphology Change of Artificial Crystal Originated Particles, and the Effect on Gate Oxide Integrity
Twan Bearda, Twan Bearda, Paul W. Mertens, Paul W. Mertens, Marc M. Heyns, Marc M. Heyns, Rüdiger Schmolke, Rüdiger Schmolke
Published in Japanese Journal of Applied Physics (01.01.2000)
Published in Japanese Journal of Applied Physics (01.01.2000)
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Journal Article
Observation of Extremely Low Defect Densities in Silicon Wafers
Schmolke, Rüdiger, Gräf, Dieter, Kirchner, Ralf, Schauer, Reinhard, Werner, Norbert, Mayer, Erwin-Peter, Wagner, Peter
Published in Japanese Journal of Applied Physics (01.04.1999)
Published in Japanese Journal of Applied Physics (01.04.1999)
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Journal Article
Körperliche und psychische Folgen des Kokain- und Crackkonsums
Haasen, Christian, Prinzleve, Michael, Zurhold, Heike, Schmolke, Rüdiger, Ilse, Julia
Published in Suchttherapie (2002)
Published in Suchttherapie (2002)
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Journal Article
Film or layer of semiconducting material, and process for producing the film or layer
Murphy, Brian, Wahlich, Reinhold, Schmolke, Rüdiger, Von Ammon, Wilfried, Moreland, James
Year of Publication 26.08.2008
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Year of Publication 26.08.2008
Patent
Film or layer made of semi-conductive material and method for producing said film or layer
Murphy, Brian, Wahlich, Reinhold, Schmolke, Rüdiger, Von Ammon, Wilfried, Moreland, James
Year of Publication 30.05.2006
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Year of Publication 30.05.2006
Patent
Method for the production of an epitaxially grown semiconductor wafer
Schmolke, Rüdiger, Schauer, Reinhard, Obermeier, Günther, Gräf, Dieter, Storck, Peter, Messmann, Klaus, Siebert, Wolfgang
Year of Publication 07.10.2003
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Year of Publication 07.10.2003
Patent
Semiconductor wafer with a thin epitaxial silicon layer, and production process
Schauer, Reinhard, Blietz, Markus, von Ammon, Wilfried, Schmolke, Rudiger
Year of Publication 29.07.2004
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Year of Publication 29.07.2004
Patent
Semiconductor wafer with a thin epitaxial silicon layer, and production process
BLIETZ MARKUS, SCHAUER REINHARD, SCHMOLKE RUDIGER, VON AMMON WILFRIED
Year of Publication 29.07.2004
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Year of Publication 29.07.2004
Patent
Film or layer of semiconducting material, and process for producing the film or layer
MORELAND JAMES, WAHLICH REINHOLD, SCHMOLKE RUDIGER, MURPHY BRIAN, VON AMMON WILFRIED
Year of Publication 14.09.2006
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Year of Publication 14.09.2006
Patent