Study of moisture transport in silicone gel for IGBT modules
Zhang, K., Schlottig, G., Mengotti, E., Quittard, O., Iannuzzo, F.
Published in Microelectronics and reliability (01.11.2020)
Published in Microelectronics and reliability (01.11.2020)
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Journal Article
Establishing Fracture Properties of EMC-Copper (-Oxide) Interfaces: Test Procedures and Simulations for Establishing the Interface Toughness, Depending on Temperature, Humidity and Mode Mixity
Ernst, L.J., Xiao, A., De Vreugd, J., Jansen, K.M.B., Pape, H., Schlottig, G., Wunderle, B.
Published in 2009 IEEE 70th Vehicular Technology Conference Fall (01.09.2009)
Published in 2009 IEEE 70th Vehicular Technology Conference Fall (01.09.2009)
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Conference Proceeding
Advances in percolated thermal underfill (PTU) simulations for 3D-integration
Kumar, S. G., Zschenderlein, U., Pantou, R., Brunschwiler, T., Schlottig, G., Schindler-Saefkow, F., Wunderle, B.
Published in 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2015)
Published in 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2015)
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Conference Proceeding
Delamination and combined compound cracking of EMC-copper interfaces
Xiao, A, Schlottig, G, Pape, H, Wunderle, B, Jansen, K M B, Ernst, L J
Published in 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) (01.06.2010)
Published in 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) (01.06.2010)
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Conference Proceeding
Interface fracture mechanics evaluation by correlation of experiment and simulation
Keller, J, Maus, I, Schlottig, G, Pape, H, Wunderle, B, Michel, B
Published in 3rd Electronics System Integration Technology Conference ESTC (01.09.2010)
Published in 3rd Electronics System Integration Technology Conference ESTC (01.09.2010)
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Conference Proceeding
Interfacial fracture parameters of silicon-to-molding compound
Schlottig, G, Maus, I, Walter, H, Jansen, K, Pape, H, Wunderle, B, Ernst, L J
Published in 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) (01.06.2010)
Published in 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) (01.06.2010)
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Conference Proceeding
Fracture toughness of Cu-EMC interfaces under pressure cooker conditions
Sadeghinia, M, Jansen, K M B, Ernst, L J, Schlottig, G, Pape, H
Published in 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2011)
Published in 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2011)
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Conference Proceeding
Procedure to determine interfacial toughness of EMC-copper (oxide) interfaces
Xiao, A, Pape, H, Schlottig, G, Wunderle, W, Leung, Y Y, Jansen, K M B, Ernst, L J
Published in 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging (01.08.2010)
Published in 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging (01.08.2010)
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Conference Proceeding
Cytotoxicity of COB materials
Uhlemann, J., Schindler, S., Schlottig, G., Drechsler, M., Starcke, S., Vollmer, G., Wolter, K.-J.
Published in Proceedings Electronic Components and Technology, 2005. ECTC '05 (2005)
Published in Proceedings Electronic Components and Technology, 2005. ECTC '05 (2005)
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Conference Proceeding
Intra-stack sealing of tier interconnects using the interconnect alloy
Kleff, J., Schlottig, G., Mrossko, R., Steller, W., Oppermann, H., Keller, J., Brunschwiler, T.
Published in 2016 6th Electronic System-Integration Technology Conference (ESTC) (01.09.2016)
Published in 2016 6th Electronic System-Integration Technology Conference (ESTC) (01.09.2016)
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Conference Proceeding
Towards cube-sized compute nodes: Advanced packaging concepts enabling extreme 3D integration
Brunschwiler, T., Schlottig, G., Sridhar, A., Bezerra, P., Ruch, P., Ebejer, N., Oppermann, H., Kleff, J., Steller, W., Jatlaoui, M., Voiron, F., Pavlovic, Z., McCloskey, P., Bremner, D., Parida, P., Krismer, F., Kolar, J., Michel, B.
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
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Conference Proceeding
Quantifying the thermal conductivity enhancement of percolating thermal underfills
Burg, Brian R., Zurcher, J., Schlottig, G., Chen, X., Brunschwiler, T.
Published in 2015 European Microelectronics Packaging Conference (EMPC) (01.09.2015)
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Published in 2015 European Microelectronics Packaging Conference (EMPC) (01.09.2015)
Conference Proceeding
Establishing the critical fracture properties of the die backside-to-molding compound interface
Schlottig, G., Pape, H., Wunderle, B., Ernst, L. J.
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
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Conference Proceeding
Fracture-mechanical interface characterisation for thermo-mechanical co-design - An effcient and comprehensive method for critical mixed-mode data extraction
Wunderle, B., Schulz, M., Keller, J., Schlottig, G., Maus, I., May, D., Holck, O., Pape, H., Michel, B.
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
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Conference Proceeding
Delamination toughness of Cu-EMC interfaces at harsh environment
Sadeghinia, M., Jansen, K. M. B., Ernst, L. J., Schlottig, G., Pape, H.
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
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Conference Proceeding
A multivariate parameter analysis of copper pillars eases the design of denser interconnects
Schlottig, G., Brunschwiler, T., Goicochea, J., Escher, W., Michel, B.
Published in 2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2012)
Published in 2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2012)
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Conference Proceeding
How to fabricate specimens for silicon-to-molding compound interface adhesion measurements
Schlottig, G., Pape, H., An Xiao, Wunderle, B., Ernst, L.
Published in 2009 11th Electronics Packaging Technology Conference (01.12.2009)
Published in 2009 11th Electronics Packaging Technology Conference (01.12.2009)
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Conference Proceeding
Induced delamination of silicon-molding compound interfaces
Schlottig, G., Pape, H., Wunderle, B., Ernst, L.J.
Published in EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2009)
Published in EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (01.04.2009)
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Conference Proceeding
Mixed mode interface characterization considering thermal residual stress
Xiao, A., Schlottig, G., Pape, H., Wunderle, B., Jansen, K., Ernst, L.J.
Published in 2008 International Conference on Electronic Packaging Technology & High Density Packaging (01.07.2008)
Published in 2008 International Conference on Electronic Packaging Technology & High Density Packaging (01.07.2008)
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Conference Proceeding
Modeling LTCC-based Microchannels Using a Network Approach
Schlottig, G., Rebenklau, L., Uhlemann, J., Nytsch-Geusen, C., Wolter, K.J.
Published in 2006 1st Electronic Systemintegration Technology Conference (01.09.2006)
Published in 2006 1st Electronic Systemintegration Technology Conference (01.09.2006)
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Conference Proceeding