by Pino-Monroy, Dayana A., Scheer, Patrick, Bouchoucha, Mohamed Khalil, Galup-Montoro, Carlos, Barragan, Manuel J., Cathelin, Philippe, Fournier, Jean-Michel, Cathelin, Andreia, Bourdel, Sylvain
Published in IEEE access (2022)

by Pino-Monroy, Dayana A., Scheer, Patrick, Bouchoucha, Mohamed Khalil, Galup-Montoro, Carlos, Barragan, Manuel J., Cathelin, Philippe, Fournier, Jean-Michel, Cathelin, Andreia, Bourdel, Sylvain
Published in IEEE access (2023)

by Negre, L., Roy, D., Cacho, F., Scheer, P., Jan, S., Boret, S., Gloria, D., Ghibaudo, G.
Published in IEEE journal of solid-state circuits (01.05.2012)

by Gauthier, Owen, Haendler, Sébastien, Scheer, Patrick, Vernhet, Alexandre, Rafhay, Quentin, Theodorou, Christoforos
Published in Solid-state electronics (01.08.2022)

by Saha, Bishwadeep, Fregonese, Sebastien, Heinemann, Bernd, Scheer, Patrick, Chevalier, Pascal, Aufinger, Klaus, Chakravorty, Anjan, Zimmer, Thomas
Published in IEEE electron device letters (01.01.2021)

by Saha, Bishwadeep, Fregonese, Sebastien, Heinemann, Bernd, Scheer, Patrick, Chevalier, Pascal, Aufinger, Klaus, Chakravorty, Anjan, Zimmer, Thomas
Published in IEEE electron device letters (01.01.2021)

by Pradeep, Krishna, Scheer, Patrick, Poiroux, Thierry, Juge, André, Ghibaudo, Gérard
Published in Semiconductor science and technology (01.05.2020)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, André, Ghibaudo, Gérard
Published in Solid-state electronics (01.01.2020)

by Martinie, Sebastien, Vaysset, Adrien, Mourrier, Yannick, Scheer, Patrick, Rozeau, Olivier
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, André, Gouget, Gilles, Ghibaudo, Gérard
Published in Solid-state electronics (01.07.2018)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, André, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Poiroux, Thierry, Rozeau, O., Scheer, Patrick, Martinie, Sebastien, Jaud, Marie-Anne, Minondo, M., Juge, Andre, Barbe, J. C., Vinet, Maud
Published in IEEE transactions on electron devices (01.09.2015)

by Gauthier, Owen, Haendler, Sebastien, Beucher, Ronan, Scheer, Patrick, Rafhay, Quentin, Theodorou, Christoforos
Published in 2023 35th International Conference on Microelectronic Test Structure (ICMTS) (27.03.2023)

by El Ghouli, Salim, Sallese, Jean-Michel, Juge, Andre, Scheer, Patrick, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2019)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Dormieu, Benjamin, Scheer, Patrick, Charbuillet, Clément, Jaouen, Hervé, Danneville, François
Published in IEEE transactions on electron devices (01.01.2013)

by Bouchoucha, Mohamed Khalil, Pino-Monroy, Dayana A., Scheer, Patrick, Cathelin, Philippe, Fournier, Jean-Michel, Barragan, Manuel J., Cathelin, Andreia, Bourdel, Sylvain
Published in 2023 IEEE International Symposium on Circuits and Systems (ISCAS) (21.05.2023)

by Martinie, Sebastien, Rozeau, Olivier, Poiroux, Thierry, Scheer, Patrick, Ghouli, Salim El, Kang, Mihyun, Juge, Andre, Lee, Harrison
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)

by Martinie, Sebastien, Rozeau, Olivier, Kolev, Plamen, Scheer, Patrick, Ghouli, Salim El, Juge, Andre, Lee, Harrison, Poiroux, Thierry
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)

by Dormieu, B., Scheer, P., Charbuillet, C., Jaouen, H., Danneville, F.
Published in IEEE transactions on electron devices (01.01.2013)