Observation of Extremely Low Defect Densities in Silicon Wafers
Schmolke, Rüdiger, Gräf, Dieter, Kirchner, Ralf, Schauer, Reinhard, Werner, Norbert, Mayer, Erwin-Peter, Wagner, Peter
Published in Japanese Journal of Applied Physics (01.04.1999)
Published in Japanese Journal of Applied Physics (01.04.1999)
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Journal Article
Pattern-based reverse-engineering of design components
Keller, Rudolf K., Schauer, Reinhard, Robitaille, Sébastien, Pagé, Patrick
Published in Proceedings / International Conference on Software Engineering (1999)
Published in Proceedings / International Conference on Software Engineering (1999)
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Conference Proceeding
Journal Article