Attack and resolution of a major product-specific systematic yield loss problem
Lahey, T.J., Olmer, L.J., Campbell, T.S., Oman, D.M., Schanzer, R.W., Shuttleworth, D.M., Patterson, O.D.
Published in 2004 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (IEEE Cat. No.04CH37530) (2004)
Published in 2004 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (IEEE Cat. No.04CH37530) (2004)
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Conference Proceeding
A very high performance and manufacturable 3.3 V 0.35-/spl mu/m CMOS technology for ASICs
Kizilyalli, I.C., Lytle, S.A., Jones, B.R., Martin, E.P., Shive, S.F., Brooks, A.L., Thoma, M.J., Schanzer, R.W., Sniegowski, J.W., Wroge, D.M., Key, R.W., Kearney, J.W., Stiles, K.R.
Published in Proceedings of Custom Integrated Circuits Conference (1996)
Published in Proceedings of Custom Integrated Circuits Conference (1996)
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