Comparison of electrical and reliability characteristics of different tunnel oxides in SONOS flash memory
Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao
Published in 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) (2006)
Published in 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) (2006)
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Conference Proceeding
A New Read-Disturb Failure Mechanism Caused by Boosting Hot-Carrier Injection Effect in MLC NAND Flash Memory
Hsin-Heng Wang, Pei-Shan Shieh, Chiu-Tsung Huang, Tokami, K., Kuo, R., Shin-Hsien Chen, Houng-Chi Wei, Pittikoun, S., Aritome, S.
Published in 2009 IEEE International Memory Workshop (01.05.2009)
Published in 2009 IEEE International Memory Workshop (01.05.2009)
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Conference Proceeding