Bridge configuration of piezoresistive devices for scanning force microscopes
Jumpertz, R., Schelten, J., Ohlsson, O., Saurenbach, F.
Published in Sensors and actuators. A. Physical. (01.10.1998)
Published in Sensors and actuators. A. Physical. (01.10.1998)
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Journal Article
Piezoresistive sensors on AFM cantilevers with atomic resolution
Jumpertz, R., Hart, A.v.d., Ohlsson, O., Saurenbach, F., Schelten, J.
Published in Microelectronic engineering (01.03.1998)
Published in Microelectronic engineering (01.03.1998)
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Journal Article
Conference Proceeding
Enhanced magnetoresistance in layered magnetic structures with antiferromagnetic interlayer exchange
Binasch, G, Grünberg, P, Saurenbach, F, Zinn, W
Published in Physical review. B, Condensed matter (01.03.1989)
Published in Physical review. B, Condensed matter (01.03.1989)
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Journal Article
Layered magnetic structures: antiferromagnetic type interlayer coupling and magnetoresistance due to antiparallel alignment
Grünberg, P., Barnas, J., Saurenbach, F., Fuβ, J.a., Wolf, A., Vohl, M.
Published in Journal of magnetism and magnetic materials (01.02.1991)
Published in Journal of magnetism and magnetic materials (01.02.1991)
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Journal Article
Conference Proceeding
Spin waves and magnetoresistance in exchange coupled layered magnetic structures
Saurenbach, F., Barnas´, J., Binasch, G., Vohl, M., Gru¨nberg, P., Zinn, W.
Published in Thin solid films (01.08.1989)
Published in Thin solid films (01.08.1989)
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Journal Article
Conference Proceeding
Electrostatic writing and imaging using a force microscope
Saurenbach, F., Terris, B.D.
Published in Conference Record of the 1990 IEEE Industry Applications Society Annual Meeting (1990)
Published in Conference Record of the 1990 IEEE Industry Applications Society Annual Meeting (1990)
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Conference Proceeding
Voltage contrast in integrated circuits with 100 nm spatial resolution by scanning force microscopy
Bohm, C, Saurenbach, F, Taschner, P, Roths, C, Kubalek, E
Published in Journal of physics. D, Applied physics (14.10.1993)
Published in Journal of physics. D, Applied physics (14.10.1993)
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Journal Article
Atomic force microscopy in effusion cytology
Ross, B, Motherby, H, Saurenbach, F, Frohn, J, Kube, M, Böcking, A
Published in Analytical and quantitative cytology and histology (01.04.1998)
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Published in Analytical and quantitative cytology and histology (01.04.1998)
Journal Article
Piezoresistive bridge configuration for atomic force microscopy
Jumpertz, R., van der Hart, A., Schelten, J., Ohlsson, O., Sulzbach, Th, Saurenbach, F.
Published in 27th European Solid-State Device Research Conference (1997)
Published in 27th European Solid-State Device Research Conference (1997)
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Conference Proceeding