A Novel Method to Extract Channel Mobility and Parasitic Resistance of 2-D Material MOSFETs
Wei, Aslan, Mahaveer Sathaiya, D., Hung, Terry Y. T., Chen, Edward, Wang, Tai-Yuan, Wu, Wen-Chia, Cheng, Chao-Ching, Radu, Iuliana P., Wu, Jeff, Wu, Chung-Cheng
Published in IEEE transactions on electron devices (01.10.2024)
Published in IEEE transactions on electron devices (01.10.2024)
Get full text
Journal Article
Comprehensive Study of Contact Length Scaling Down to 12 nm With Monolayer MoS2 Channel Transistors
Wu, Wen-Chia, Hung, Terry Y. T., Sathaiya, D. Mahaveer, Arutchelvan, Goutham, Hsu, Chen-Feng, Su, Sheng-Kai, Chou, Ang Sheng, Chen, Edward, Shen, Yun-Yang, Liew, San Lin, Hou, Vincent, Lee, T. Y., Cai, Jin, Wu, Chung-Cheng, Wu, Jeff, Wong, H.-S. Philip, Cheng, Chao-Ching, Chang, Wen-Hao, Radu, Iuliana P., Chien, Chao-Hsin
Published in IEEE transactions on electron devices (01.12.2023)
Published in IEEE transactions on electron devices (01.12.2023)
Get full text
Journal Article
Building high performance transistors on carbon nanotube channel
Pitner, Gregory, Safron, Nathaniel, Chao, Tzu-Ang, Li, Shengman, Su, Sheng-Kai, Zeevi, Gilad, Lin, Qing, Chiu, Hsin-Yuan, Passlack, Matthias, Zhang, Zichen, Sathaiya, D. Mahaveer, Wei, Aslan, Gilardi, Carlo, Chen, Edward, Liew, San-Lin, Hou, Vincent D.-H., Wu, Chung-Wei, Wu, Jeff, Lin, Zhiwei, Fagan, Jeffrey, Zheng, Ming, Wang, Han, Mitra, Subhasish, Philip Wong, H.-S., Radu, Iuliana
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Get full text
Conference Proceeding
Scaled contact length with low contact resistance in monolayer 2D channel transistors
Wu, Wen-Chia, Hung, Terry Y.T., Sathaiya, D. Mahaveer, Fan, Dongxu, Arutchelvan, Goutham, Hsu, Chen-Feng, Su, Sheng-Kai, Chou, Ang Sheng, Chen, Edward, Li, Weisheng, Yu, Zhihao, Qiu, Hao, Yang, Ying-Mei, Lin, Kuang-I, Shen, Yun-Yang, Chang, Wen-Hao, Liew, San Lin, Hou, Vincent, Cai, Jin, Wu, Chung-Cheng, Wu, Jeff, Philip Wong, H.-S., Wang, Xinran, Chien, Chao-Hsin, Cheng, Chao-Ching, Radu, Iuliana P.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Get full text
Conference Proceeding
Status and Performance of Integration Modules Toward Scaled CMOS with Transition Metal Dichalcogenide Channel
Chou, Ang-Sheng, Hsu, Ching-Hao, Lin, Yu-Tung, Arutchelvan, Goutham, Chen, Edward, Hung, Terry Y.T., Hsu, Chen-Feng, Chou, Sui-An, Lee, Tsung-En, Madia, Oreste, Doornbos, Gerben, Su, Yuan-Chun, Azizi, Amin, Sathaiya, D. Mahaveer, Cai, Jin, Wang, Jer-Fu, Chung, Yun-Yan, Wu, Wen-Chia, Neilson, Katie, Yun, Wei-Sheng, Hsu, Yu-Wei, Hsu, Ming-Chun, Hou, Fa-Rong, Shen, Yun-Yang, Chien, Chao-Hsin, Wu, Chung-Cheng, Wu, Jeff, Wong, H.-S. Philip, Chang, Wen-Hao, van Dal, Mark, Cheng, Chao-Ching, Wu, Chih-I, Radu, Iuliana P.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Get full text
Conference Proceeding
Comprehensive Study of Contact Length Scaling Down to 12 nm With Monolayer MoS 2 Channel Transistors
Wu, Wen-Chia, Hung, Terry Y. T., Sathaiya, D. Mahaveer, Arutchelvan, Goutham, Hsu, Chen-Feng, Su, Sheng-Kai, Chou, Ang Sheng, Chen, Edward, Shen, Yun-Yang, Liew, San Lin, Hou, Vincent, Lee, T. Y., Cai, Jin, Wu, Chung-Cheng, Wu, Jeff, Wong, H.-S. Philip, Cheng, Chao-Ching, Chang, Wen-Hao, Radu, Iuliana P., Chien, Chao-Hsin
Published in IEEE transactions on electron devices (01.12.2023)
Published in IEEE transactions on electron devices (01.12.2023)
Get full text
Journal Article
On the Extreme Scaling of Transistors with Monolayer MOS2 Channel
Wu, Wen-Chia, Hung, Terry Y.T., Sathaiya, D. Mahaveer, Chen, Edward, Hsu, Chen-Feng, Yun, Walker, Hu, Hsiang-Chi, Liu, Bo-Heng, Lee, T.Y., Kei, Chi-Chung, Chang, Wen-Hao, Cai, Jin, Jeff, W., Wu, Chung-Cheng, Wong, H.-S. Philip, Chien, Chao-Hsin, Cheng, Chao-Ching, Radu, Iuliana P.
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Get full text
Conference Proceeding
Comprehensive Physics Based TCAD Model for 2D MX2 Channel Transistors
Sathaiya, D. Mahaveer, Hung, Terry Y.T., Chen, Edward, Wu, Wen-Chia, Wei, Aslan, Chuu, Chih-Piao, Su, Sheng-Kai, Chou, Ang Sheng, Chung, Cheng-Ting, Chien, Chao-Hsin, Wang, Han, Cai, Jin, Wu, Chung-Cheng, Radu, Iuliana P., Wu, Jeff
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)
Get full text
Conference Proceeding
Monolayer-MoS2 Stacked Nanosheet Channel with C-type Metal Contact
Chung, Yun-Yan, Yun, Wei-Sheng, Chou, Bo-Jhih, Hsu, Chen-Feng, Yu, Shao-Ming, Arutchelvan, G., Li, Ming-Yang, Lee, Tsung-En, Lin, Bo-Jiun, Li, Chen-Yi, Wei, Aslan, Sathaiya, D. Mahaveer, Chung, Cheng-Ting, Liew, San-Lin, Hou, Vincent D.-H., Chang, Wen-Hao, Liu, Bo-Heng, Chen, Chien-Wei, Su, Chien-Ying, Kei, Chi-Chung, Cai, Jin, Wu, Chung-Cheng, Wu, Jeff, Lee, Tung-Ying, Chien, Chao-Hsin, Cheng, Chao-Ching, Radu, Iuliana P.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Get full text
Conference Proceeding